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Nanoscale Surface Analysis of High Entropy Alloy

Hsin-Hui Huang, Meguya Ryu, Yoshiaki Nishijima, Haoran Mu, Mohit Kumar, Nguyen Hoai An Le, Adrian Cernescu, Jitraporn Vongsvivut, Andrew Siao Ming Ang, Lina Grineviciute, Challapalli Subrahmanyam, Junko Morikawa, Saulius Juodkazis

Abstract

Nanoscale surface analysis of 1 micrometer thick high entropy alloys (HEAs) was carried out using nano-IR for hyperspectral imaging and single point spectroscopy in the 700-1700 1/cm spectral range. Nano-IR is based on the detection of scattered light from an oscillating metal coated nano-tip in one of the arms of the Fourier transform infrared spectrometer and has a resolution defined by the tip radius of the probe, 20 nm, regardless of the excitation wavelength. HEA CuPdAgPtAu showed an absorption and reflection increase at 900-1100 1/cm band, which is consistent with Drude-Lorenz modeling of permittivity, however, could also signify oxide formation as tested by X-ray photoelectron spectroscopy of CuPdAgPtAu and CrFeCoNiCuMo. Realization of polarization analysis for nano-IR nano-spectroscopy in the plane perpendicular to the sample's surface is discussed and modeled. The currently available modality of surface analysis with the excitation-detection mode of the p-pol. antenna can be extended to full 3D analysis of the orientational dependencies of local absorbance and refractive index.

Nanoscale Surface Analysis of High Entropy Alloy

Abstract

Nanoscale surface analysis of 1 micrometer thick high entropy alloys (HEAs) was carried out using nano-IR for hyperspectral imaging and single point spectroscopy in the 700-1700 1/cm spectral range. Nano-IR is based on the detection of scattered light from an oscillating metal coated nano-tip in one of the arms of the Fourier transform infrared spectrometer and has a resolution defined by the tip radius of the probe, 20 nm, regardless of the excitation wavelength. HEA CuPdAgPtAu showed an absorption and reflection increase at 900-1100 1/cm band, which is consistent with Drude-Lorenz modeling of permittivity, however, could also signify oxide formation as tested by X-ray photoelectron spectroscopy of CuPdAgPtAu and CrFeCoNiCuMo. Realization of polarization analysis for nano-IR nano-spectroscopy in the plane perpendicular to the sample's surface is discussed and modeled. The currently available modality of surface analysis with the excitation-detection mode of the p-pol. antenna can be extended to full 3D analysis of the orientational dependencies of local absorbance and refractive index.

Paper Structure

This paper contains 17 sections, 2 equations, 11 figures.

Figures (11)

  • Figure 1: (a) Optical image of a side-view microtome cut Au-HEA sample on black Kapton. Thickness of the microtome slice $960\pm 40$ nm (see SEM inset). Resolution of optical micro-image 0.7 $\mu$m. (b) Topography (height) from $8\times 8~\mu$m$^2$ in $200\times 100$ pixels, 9 ms/pixel. (c) IR optical signal (spectrally integrated); see Fig. \ref{['f-AR']} for the reflectance and absorbance maps and averaged spectra along A-A' image cross section.
  • Figure 2: Spectral mapping: 50 spectra recorded across 5 $\mu$m distance; spectral resolution: 12.5 cm$^-1$, measurement time 42 minutes. (a) Nano-FTIR reflectivity. (b) Nano-FTIR absorption. (c) Reflectivity averaged over three materials: black Kapton (top in (a,b)), Au-HEA (middle), microtome polymer matrix (bottom).
  • Figure 3: Maps of nano-FTIR reflectance, absorbance, and averaged absorbance for: black Kapton (left), Au-HEA (middle), microtome polymer matrix (right). The black-Kapton bands are referenced well to polyimide with recognisable Si-O-Si (or Si-OH) bands related to silica filler.
  • Figure 4: Topography (height) and IR optical maps: $5\time 5~\mu$m$^2$, $150\times 150$ pixels, 9 ms/pixel. Nano-FTIR reflectance and absorbance at six random locations (normalised to Si). Sample: cover glass coated with Au-HEA. Experiment: 10 averaged interferograms per measurement point; 1024 pixels per interferogram, 10 ms per pixel, spectral resolution 12.5 cm$^{-1}$.
  • Figure 5: X-ray photo-electron spectrum (XPS) analysis of two HEA samples on black Kapton: (a) Au-HEA CuPdAgPtAu and (b) Fe-HEA CrFeCoNiCuMo. Carbon was not taken into account for elemental atomic concentrations in (a); it is not shown in (b). Au-HEA and Fe-HEA were Ar plasma cleaned for 2 min and 4 min, respectively before quantification measurement was taken.
  • ...and 6 more figures