Finite-Time Observability of Oscillatory Instabilities in Synchronous p-bit Dynamics
Naoya Onizawa, Shunsuke Koshita, Takahiro Hanyu
Abstract
Synchronous update schemes in p-bit annealing offer a natural route to massive parallelism, but they can also induce period-2 oscillations that degrade optimization performance. In practical solvers, such oscillations matter only if they become observable within the finite runtime of the device or simulation, yet most existing analyses are formulated in terms of asymptotic stability. As a result, they do not directly address the experimentally relevant question of when oscillatory modes actually appear during finite-duration annealing. Here we develop a finite-time observability framework for synchronous tick-random p-bit dynamics. Starting from a linearized mean-field description, we derive a graph-dependent criterion that predicts whether unstable modes amplify enough within a finite observation window to produce visible signatures in quantities such as the one-step autocorrelation and the energy trace. This shifts the analysis from asymptotic instability to practical detectability and yields a principled estimate of the minimum reduction in synchrony required to suppress oscillations. We validate the framework on G-set benchmark graphs and illustrative graph families. The predicted thresholds capture both the graph dependence of oscillation onset and the finite-time conditions under which oscillations become practically observable. These results provide a graph-aware basis for selecting the update probability in synchronous p-bit annealers without relying on exhaustive instance-by-instance parameter sweeps.
