EPAR: Electromagnetic Pathways to Architectural Reliability in Quantum Processors

Abstract

As superconducting processors scale, understanding how physical layout shapes qubit interactions is essential for architectural reliability. Existing methods offer limited insight into how electromagnetic design choices translate into execution-level behavior. We present EPAR, an electromagnetic-to-architecture framework that predicts robustness early directly from physical design by reconstructing how design distortion modifies the effective Hamiltonian, reroutes mediated connectivity, and influences control-pulse response. Across all tested layouts, EPAR's structural scores show 100% agreement with two-qubit error trends yet reveal over 10X robustness differences among edges with identical calibrated error rates, going beyond conventional metrics to provide improved and actionable compiler guidance.

Figures (4)

• Figure 1: Overview of our proposed EPAR workflow.
• Figure 2: Circuit-level view of a two-qubit one coupler subsystem.
• Figure 3: LTD exposes layout-induced distortion and identifies structurally weak edges across design sweeps.
• Figure 4: SI uncovers regime-dependent fragility, uncovering the sensitivity pathways responsible for pulse-driven error.