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Predicting electron-phonon coupling and electronic transport at the moiré scale in twisted bilayer graphene

David J. Abramovitch, Marco Bernardi

Abstract

First-principles calculations can accurately describe electron-phonon (e-ph) interactions and electronic transport in a wide range of materials, but are currently limited to unit cells with up to $\sim$100 atoms due to computational cost. Here, we develop an atomistic electronic potential with Holstein- and Peierls-like terms for modeling e-ph interactions and phonon-limited electronic transport that enables the study of moiré systems with thousands of atoms per unit cell. This method can accurately reproduce first-principles e-ph coupling and resistivity in graphene and large-angle twisted bilayer graphene (TBG). Using this approach, we study TBG over a range of twist angles down to 1.6$^\circ$ (5044-atom unit cell), and report the evolution of e-ph interactions and phonon-limited resistivity with twist angle. The predicted resistivity increases by two orders of magnitude between 13.2$^\circ$ and 1.6$^\circ$, driven by the progressive reduction of the electronic energy scale. Our calculations can predict key experimental trends in 2.0$^\circ$ and 1.6$^\circ$ TBG, including the resistivity and its dependence on temperature and band filling. Our work establishes a scalable approach for quantitative studies of e-ph interactions and transport in moiré materials and other systems with previously inaccessible length scales.

Predicting electron-phonon coupling and electronic transport at the moiré scale in twisted bilayer graphene

Abstract

First-principles calculations can accurately describe electron-phonon (e-ph) interactions and electronic transport in a wide range of materials, but are currently limited to unit cells with up to 100 atoms due to computational cost. Here, we develop an atomistic electronic potential with Holstein- and Peierls-like terms for modeling e-ph interactions and phonon-limited electronic transport that enables the study of moiré systems with thousands of atoms per unit cell. This method can accurately reproduce first-principles e-ph coupling and resistivity in graphene and large-angle twisted bilayer graphene (TBG). Using this approach, we study TBG over a range of twist angles down to 1.6 (5044-atom unit cell), and report the evolution of e-ph interactions and phonon-limited resistivity with twist angle. The predicted resistivity increases by two orders of magnitude between 13.2 and 1.6, driven by the progressive reduction of the electronic energy scale. Our calculations can predict key experimental trends in 2.0 and 1.6 TBG, including the resistivity and its dependence on temperature and band filling. Our work establishes a scalable approach for quantitative studies of e-ph interactions and transport in moiré materials and other systems with previously inaccessible length scales.
Paper Structure (3 equations, 4 figures)

This paper contains 3 equations, 4 figures.

Figures (4)

  • Figure 1: (a) E-ph coupling computed in this work, $g_{\nu}(\mathbf{k} \!=\! K, \mathbf{q}) = (\frac{1}{N_b}\sum_{nm} |g_{nm\nu}(\mathbf{k} = K, \mathbf{q})|^2)^{1/2}$ averaged over Dirac-cone bands, plotted on the phonon dispersion for 21.8° TBG. (b) Same plot as in (a), but with phonons and e-ph coupling from DFPT. (c) Resistivity in MLG, calculated with our approach and from DFPT e-ph coupling gao_firstprinciples_2024, in both cases using the RTA.
  • Figure 2: (a) Temperature dependent resistivity of 2.0° TBG computed for several electronic fillings (solid lines) and compared to experiments (symbols) chung_transport_2018. (b) Filling-dependent resistivity in 2.0° TBG at several temperatures. The moiré bands are completely filled / empty at $n \!=\! \pm 9.3 \times 10^{12}$ cm$^{-2}$.
  • Figure 3: (a) Twist angle dependence of the resistivity at several temperatures for a Fermi energy located halfway to the upper VHS. (b) Twist angle dependence of the e-ph coupling strength $\lambda$ at four fillings.
  • Figure 4: Calculated band structure of (a) 13.2°, (b) 3.15°, and (c) 1.61° TBG, respectively. For the same sequence of twist angles, we show the temperature dependent resistivity at several electronic fillings in panels (d)-(f), and the resistivity as a function of electron filling at several temperatures in panels (g)-(i), respectively.