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Recent application studies of an INTPIX4NA SOIPIX detector-based X-ray camera using an SiTCP-XG 10GbE-based high-speed readout system at KEK facilities

Ryutaro Nishimura, Noriyuki Igarashi, Daisuke Wakabayashi, Yuki Shibazaki, Yoshio Suzuki, Keiichi Hirano, Hiromi Miki, Akio Yoneyama, Hiroshi Sugiyama, Kazuyuki Hyodo, Izumi Umegaki, Koichiro Shimomura, Yasuo Arai

Abstract

The Silicon-On-Insulator PIXel (SOIPIX) detector is a unique monolithic structure imaging device currently being by the SOIPIX group, led by the High Energy Accelerator Research Organization (KEK). Our detector team at the KEK Photon Factory (PF) has developed an X-ray camera based on the INTPIX4NA SOIPIX detector. This detector provides a sensitive area of 14.1 $\times$ 8.7 $\mathrm{mm^2}$, with 425,984 pixels arranged in an 832-column $\times$ 512-row matrix and a pixel size of 17 $\times$ 17 $\mathrm{μm^{2}}$, and offers high spatial resolution and excellent sensitivity under low intensity X ray conditions. The readout system used in the X-ray camera is developed at the PF. It is equipped with SiTCP-XG, a 10 Gb Ethernet network controller implemented on a field-programmable gate array, enabling high-frame-rate imaging at several hundred hertz. We are currently investigating the applicability of this X-ray camera in several experiments at KEK. Herein, we report three recent application studies: (1) application to the optics of an X-ray zooming microscope using two Fresnel zone plates at PF AR-NE1A; (2) application to a phase-contrast X-ray imaging system using a two-crystal X-ray interferometer at the PF BL-14C beamline; and (3) application to nondestructive detection of lithium in Li-ion battery electrode materials using muonic X-rays at J-PARC MLF Muon D2.

Recent application studies of an INTPIX4NA SOIPIX detector-based X-ray camera using an SiTCP-XG 10GbE-based high-speed readout system at KEK facilities

Abstract

The Silicon-On-Insulator PIXel (SOIPIX) detector is a unique monolithic structure imaging device currently being by the SOIPIX group, led by the High Energy Accelerator Research Organization (KEK). Our detector team at the KEK Photon Factory (PF) has developed an X-ray camera based on the INTPIX4NA SOIPIX detector. This detector provides a sensitive area of 14.1 8.7 , with 425,984 pixels arranged in an 832-column 512-row matrix and a pixel size of 17 17 , and offers high spatial resolution and excellent sensitivity under low intensity X ray conditions. The readout system used in the X-ray camera is developed at the PF. It is equipped with SiTCP-XG, a 10 Gb Ethernet network controller implemented on a field-programmable gate array, enabling high-frame-rate imaging at several hundred hertz. We are currently investigating the applicability of this X-ray camera in several experiments at KEK. Herein, we report three recent application studies: (1) application to the optics of an X-ray zooming microscope using two Fresnel zone plates at PF AR-NE1A; (2) application to a phase-contrast X-ray imaging system using a two-crystal X-ray interferometer at the PF BL-14C beamline; and (3) application to nondestructive detection of lithium in Li-ion battery electrode materials using muonic X-rays at J-PARC MLF Muon D2.
Paper Structure (12 sections, 11 figures, 1 table)

This paper contains 12 sections, 11 figures, 1 table.

Table of Contents

  1. Introduction
  2. INTPIX4NA Detector-Based X-ray Camera
  3. Overview of the INTPIX4NA SOIPIX Detector
  4. Overview of the INTPIX4NA Detector-Based X-ray Camera
  5. Application Studies and Discussion
  6. Application to the Optics of an X-ray Zooming Microscope Using two Fresnel Zone Plates at PF AR-NE1A
  7. Computed Laminography of High-Pressure Sample in a Diamond Anvil Cell
  8. Schlieren Phase-Contrast Microscopy of Fiber Texture in Japanese Traditional Paper "Washi"
  9. Application to a Phase-Contrast X-ray Imaging System Using a two-Crystal X-ray Interferometer at the PF BL-14C beamline
  10. Application to Nondestructive Detection of Metallic Lithium in Li-ion Battery Electrode Materials Using Muonic X-rays at J-PARC MLF Muon D2
  11. Conclusions
  12. Acknowledgements

Figures (11)

  • Figure 1: Structure of SOIPIX detector.
  • Figure 2: Photograph of INTPIX4NA from circuit layer side.
  • Figure 3: Schematics of the INTPIX4NA detector-based X-ray camera. The upper half of this figure shows an overview of the components. The lower half displays photographs of the components and a DAQ software screenshot.
  • Figure 4: Overview of the optics of an X-ray zooming microscope using two FZPs at PF AR-NE1A. In this optical system, the 1-FZP mode using only the FZP1 allows for low-magnification images (the small, dark-colored sample image on detector plane in the figure), the 2-FZPs mode using FZP1 and FZP2 in combination enables high-magnification images (the large, bright-colored sample image on detector plane in the figure).
  • Figure 5: Computed laminography of a high-pressure sample in the DAC (E=9.6 keV). (a) Setup of DAC for laminography measurement. (b) One shot of the small rubby ball sample in the DAC, from laminography dataset.
  • ...and 6 more figures