Metrology for Quantum Hardware Standardization -- Charting a Pathway: A Strategic Review

Abstract

Advances in quantum mechanics have long underpinned metrology by enabling practical realizations of units through quantum effects. With the 2019 SI revision, traceability is anchored in defined fundamental constants, reinforcing the quantum-mechanical basis of modern standards. In parallel, quantum technologies are transitioning from laboratory science to engineering and early industrial deployment, bringing familiar pressures for integration, reliability, cost reduction, supply-chain formation, and standardization. The direction of benefit is thus reversing: metrology and precision measurement are becoming enabling infrastructure for the industrialization of quantum technologies. Against this backdrop, this paper surveys the metrology and precision-measurement capabilities required across representative quantum-computing modalities and identifies where electrical and related metrology can contribute to the development, characterization, and reliable operation of quantum hardware. We then discuss cross-cutting measurement needs and standardization opportunities that recur across platforms, and note how similar frameworks can extend to emerging quantum-sensing applications.

Figures (4)

• Figure 1: Until the 2019 SI revision, quantum metrological standards were established by leveraging quantum effects. Today, those quantum metrological standards and the precision measurement technologies built on them are poised to contribute to the quantum industry.
• Figure 2: NMI-Q MoU signature event at LNE, Paris on October 15, 2025
• Figure 3: A schematic of the proposed collaboration framework between IEC/ISO JTC 3 and technical committees (TCs) of ISO, IEC, and other standards development organizations (SDOs) in developing (i) International Standards (ISs) that specify evaluation and test methods for technologies within the remit of specific TCs, and (ii) Technical Reports (TRs) that provide cross-cutting evaluation methodologies for the magnetic properties of materials and components spanning multiple TCs. TCs may establish liaisons with IEC/ISO JTC 3 and develop ISs by drawing on the TRs and the terminology produced by IEC/ISO JTC 3. Where relevant TCs lack the technical capacity to develop an IS, IEC/ISO JTC 3 may itself initiate and develop the IS, as appropriate. Terminology and definitions should also be developed within IEC/ISO JTC 3 to ensure consistency across the activities of all TCs and to avoid discrepancies.
• Figure 4: A schematic of the proposed collaboration framework between IEC/ISO JTC 3 and technical committees (TCs) of ISO, IEC, and other standards development organizations (SDOs) in developing (i) International Standards (ISs) that specify evaluation and test methods for technologies within the remit of specific TCs, and (ii) Technical Reports (TRs) that provide cross-cutting evaluation methodologies for diamond NV centers spanning multiple TCs. TCs may establish liaisons with IEC/ISO JTC 3 and develop ISs by drawing on the TRs and the terminology produced by IEC/ISO JTC 3. Where relevant TCs lack the technical capacity to develop an IS, IEC/ISO JTC 3 may itself initiate and develop the IS, as appropriate. For electrocardiography (ECG) and magnetoencephalography (MEG), TC-specific standardization is typically developed under IEC TC 62 (Electrical equipment in medical practice), in particular SC 62D (Medical electrical equipment) for ECG. Terminology and definitions should also be developed within IEC/ISO JTC 3 to ensure consistency across the activities of all TCs and to avoid discrepancies.