Precise Measurement and Control of Radon Progeny on Detector Surfaces
C. B. Z. Luo, C. Guo, L. P. Xiang, Y. H. Niu, F. G. Mo, J. C. Liu, Y. P. Zhang, C. G. Yang
Abstract
In low-background particle physics experiments, surface deposition of radon progeny presents a significant background challenge. To characterize this contamination, a high-sensitivity surface $α$-activity measurement system was developed, which employs a 3$\times$3 Si-PIN array operating in vacuum to perform $α$-spectroscopy on samples. The system was calibrated using Poly(Methyl MethAcrylate) (PMMA) plates exposed to a controlled high-radon atmosphere, achieving an energy resolution of 2.09 \% for 5.30~MeV $α$ particles and a one-day measurement sensitivity of 1.27~$μ$Bq/cm$^2$ for $^{210}$Po surface activity. Using this system and a self-built high radon concentration chamber, the deposition behavior of radon progeny on PMMA surfaces was investigated. Results indicate a non-monotonic dependence on exposure time, a significant enhancement of deposition with increasing negative surface electrostatic potential, and a strong modulation by ambient humidity. This paper details the apparatus design, calibration, and experimental study of radon progeny deposition dynamics on PMMA surfaces.
