Electrodynamics of swift-electron momentum transfer to a large spherical nanoparticle
Jesús Castrejón-Figueroa, Jorge Luis Briseño-Gómez, Eduardo Enrique Viveros-Armas, José Ángel Castellanos-Reyes, Alejandro Reyes-Coronado
Abstract
Swift electrons from highly focused beams produced in aberration-corrected scanning transmission electron microscopes offer a powerful route for probing and manipulating matter at the nanoscale. Although linear momentum transfer from swift electrons to nanoparticles has been investigated theoretically and experimentally, subsequent analyzes revealed that several earlier predictions relied on non-causal dielectric functions or insufficient numerical convergence, leading to spurious sign reversals in the transferred momentum. Here, we derive analytical expressions and develop a numerically efficient electrodynamic framework to compute the linear momentum transferred from a swift electron to an isolated spherical nanoparticle described by a fully causal, local dielectric response. We apply our framework to large nanoparticles with 50 nm radius and explicitly resolve the spectral density of linear momentum transfer across the full frequency domain. Using causal dielectric functions for aluminum and bismuth, we analyze the role of electron velocity, impact parameter, and material-specific resonances. We find that, when causality and full multipolar convergence are enforced, the net transverse linear momentum transferred to spherical nanoparticles remains attractive toward the electron trajectory for all nanoparticles considered, despite the presence of material-dependent sign changes in individual electric and magnetic contributions. These results contrast with earlier theoretical predictions of net repulsive behavior and indicate that additional physical mechanisms beyond the present isolated, local description are required to account for experimentally observed repulsion. Our work establishes a robust reference framework for momentum transfer calculations and provides quantitative benchmarks relevant for electron-beam-based nanoscale manipulation.
