Convergent-Beam X-ray Crystallography
Chufeng Li, Margarita Zakharova, Mauro Prasciolu, Jia Chyi Wong, Holger Fleckenstein, Nikolay Ivanov, Wenhui Zhang, Mansi Butola, J. Lukas Dresselhaus, Ivan De Gennaro Aquino, Dmitry Egorov, Philipp Middendorf, Alessa Henkel, Bjarne Klopprogge, Lars Klemeyer, Tobias Beck, Oleksandr Yefanov, Miriam Barthelmess, Janina Sprenger, Dominik Oberthuer, Saša Bajt, Henry N. Chapman
TL;DR
Convergent-beam X-ray diffraction (CBXD) integrates high-convergence optics with diffraction topography to map Bragg reflections across a crystal volume, enabling spatially resolved structure-factor measurements. The authors develop a geometric and data-analysis framework that combines snapshot and rotation CBXD, including tomographic reconstruction of crystal morphology and the computation of structure factors as a function of position within the crystal. They validate the approach on silicon and vitamin B$_{12}$ crystals, achieving structure-factor accuracy within a few percent after applying corrections for polarization, Lorentz factor, and absorption, and they demonstrate 3D reconstruction of crystal shape via tomography. The method offers a versatile route to study diffusion, binding, growth, and dynamic responses in molecular, polymeric, and MOF crystals, potentially enabling region-specific crystallography and dose-aware analyses in time-resolved experiments.
Abstract
Molecular and polymeric crystals show a wide range of functional properties that arise from the interplay between the atomic-scale structure of their constituent molecules and the organization of these molecules within the crystal lattice at macroscopic length scales. X-ray diffraction can provide structural information at these disparate length scales, but usually only through experiments that address one or the other of molecular (or unit-cell) structure versus crystal structure. Consequently, the accuracy of determined molecular or polymer structures may be limited by unaccounted crystal inhomogeneities of the crystal lattice and the characterization of crystalline materials might not reveal the underlying causes of crystal morphology. Here we introduce X-ray convergent-beam diffraction to obtain spatially-resolved structural information from crystals by projection topographic imaging. Using highly focusing X-ray multilayer Laue lenses, we show that Bragg reflections can be mapped into tomographic images of the crystal, for the characterization of strain and defects at high resolution. We demonstrate how the crystal morphology obtained this way can be accounted for when determining structure factors as a function of position in the crystal. The approach may assist in studies such as diffusion and binding in MOFS, protein-drug binding, crystal growth, and the mechanical responses of photo-reactive or thermally driven dynamic crystals.
