Systematic Analysis of Ferroelectric Domain Dynamics in Periodically Poled Lithium Niobate Waveguides Using Two-Photon Microscopy and Digital Imaging Processing
Jiuyi Zhang, Christopher Cullen, Matthew Konkol, Peng Yao, Timothy Creazzo, Janusz Murakowski, Ruidong Xue, Xiaofeng Zhu, Md Omar Faruk Rasel, Yash Kabra, Dennis Prather
Abstract
We present a characterization and analysis methodology suitable for volume production for characterizing and optimizing x-cut thin-film periodically poled lithium niobate (PPLN) devices using two-photon (2P) microscopy with quantitative image processing. This method enables direct extraction of key structural parameters, such as duty cycle, phase-matching behavior, and domain uniformity, across large device sets in a non-destructive manner. By correlating 2P microscopy-derived structural metrics with systematic variations in poling conditions, we establish a scalable, image-driven approach for evaluating and improving PPLN fabrication. The resulting workflow supports wafer-level process development and accelerates the manufacturing and packaging of lithium niobate photonic integrated circuits (PICs).
