Simultaneous measurement of Raman and nonlinear optical tensors
Volodymyr Multian, Luigi Bonacina, Jérémie Teyssier
TL;DR
The paper presents a unified polarization-resolved platform for simultaneous Raman and SHG microscopy, exploiting a Bessel-Gaussian focal field to access complete Raman and second-order nonlinear optical tensors. A BG-driven MRA-SHG method paired with a polarization-resolved ray-tracing model and GPU-accelerated optimization enables rapid, quantitative extraction of $\chi^{(2)}$ and Raman tensors from micro-scale samples. Validation on KDP and LiNbO3 demonstrates accurate tensor recovery and consistent crystal orientation fitting, with Kleinman symmetry supported under near-IR excitation. The approach offers a robust pathway to characterize nonlinear optical properties in nano-objects and 2D materials, potentially enabling global tensor fitting from polarization maps of randomly oriented dielectrics.
Abstract
Raman spectroscopy and Second Harmonic Generation (SHG) are complementary, non-destructive techniques that provide rich and distinct insights into the structural and electronic properties of materials. Raman spectroscopy offers detailed information on vibrational modes, phase transitions, temperature, and local stress, while SHG is highly sensitive to symmetry and orientation, particularly in non-centrosymmetric structures. In this work, in addition to combining both techniques, we propose a novel approach to determine the nonlinear optical tensor, leveraging the spatial and ultra-fast temporal offset of a Bessel-Gaussian laser beam at the microscope's focal point.
