Efficient Bayesian Inference in Strictly Semi-parametric Linear Inverse Problems
Adel Magra, Aad van der Vaart
TL;DR
This work develops a rigorous semi-parametric Bayesian framework for inverse problems where the forward map $K_\theta$ is linear in an infinite-dimensional signal $f$ but the operator depends on a scalar parameter $\theta$. By combining LAN expansions, least favourable directions, and posterior contraction results with carefully chosen priors (notably re-scaled Gaussian process priors), the authors prove Bernstein–von Mises theorems for the marginal posterior of $\theta$, enabling asymptotically optimal uncertainty quantification. They establish regularity, identifiability, and contraction conditions in abstract form, then instantiate them in two concrete applications: semi-blind deconvolution and attenuated X-ray transforms, including both symmetric/zero-location deconvolution models and constant attenuation X-ray settings. The results yield explicit rates and conditions under which the $\theta$-posterior is asymptotically Gaussian with a variance given by the efficient information, highlighting how ill-posedness can aid parametric inference in this mixed parametric-nonparametric regime. Practical impact lies in providing principled, computable uncertainty quantification for location and attenuation parameters in imaging-type inverse problems, with guidance on priors and regularity needed to achieve BvM behavior.
Abstract
We consider the efficient inference of finite dimensional parameters arising in the context of inverse problems. Our setup is the observation of a transformation of an unknown infinite dimensional signal $f$ corrupted by statistical noise, with the transformation $K_θ$ being linear but unknown up to a scalar $θ$. We adopt a Bayesian approach and put a prior on the pair $(θ,f)$ and prove a Bernstein-von Mises theorem for the marginal posterior of $θ$ under regularity conditions on the operators $K_θ$ and on the prior. We apply our results to the recovery of location parameters in semi-blind deconvolution problems and to the recovery of attenuation constants in X-ray tomography.
