Analysis of LLM Vulnerability to GPU Soft Errors: An Instruction-Level Fault Injection Study
Duo Chai, Zizhen Liu, Shuhuai Wang, Songwei Pei, Cheng Liu, Huawei Li, Shangguang Wang
TL;DR
This work targets the reliability of large language models running on GPUs by performing an instruction-level fault-injection study with NVBitFI. It introduces an end-to-end LLM Reliability Evaluation Framework, analyzes five vulnerability dimensions, and defines the Model Vulnerability Factor ($MVF$) as the sum of $DUE$ and $SDC$ to quantify user-visible failures. Key findings show that fault vulnerability is highly dependent on task, architecture, model scale, bit-position, and operator type; a practical MVF approximation from Instruction Vulnerability Factors accurately tracks actual vulnerability across models. The results offer actionable guidance for fault-tolerance strategies, such as prioritizing protection for high-risk bits and the output layer, while leveraging normalization and architecture-aware design to improve robustness in GPU-accelerated LLM inference.
Abstract
Large language models (LLMs) are highly compute- and memory-intensive, posing significant demands on high-performance GPUs. At the same time, advances in GPU technology driven by shrinking transistor sizes and lower operating voltages have made these devices increasingly susceptible to soft errors. While prior work has examined GPU reliability, most studies have focused on general-purpose applications or conventional neural networks mostly used for vision tasks such as classification and detection. In contrast, systematic analysis of modern large-scale LLMs remains limited, despite their rapid adoption in diverse application scenarios. Given the unique characteristics of LLMs, their resilience to soft errors may differ substantially from earlier models. To bridge this gap, we conduct the first instruction-level fault injection study of LLM inference. Our approach reveals reliability characteristics from multiple perspectives, highlighting the effects of model architecture, parameter scale, and task complexity. These findings provide new insights into LLM reliability and inform the design of more effective fault tolerance mechanisms.
