U-Bit Collapse in Arnault Composites:Probing the Boundary of Strong Lucas Pseudoprimes
Bowman Hall
TL;DR
The study addresses whether Arnault-type composites engineered to pass Miller–Rabin tests through base 11 can also evade the strong Lucas component of Baillie–PSW. It constructs 3-prime Arnault composites targeting ~350-bit numbers and measures Lucas degeneracy with the collapse metric delta(n,D) = log_2 n − log_2(U_d mod n) across discriminants with (D/n) = -1. Across 200 samples, all composites fail the strong Lucas test; the mean delta is 1.61 bits, with a median of 1.0 and a maximum of 8, and 26% show no collapse at all, indicating near independence between MR resistance and Lucas behavior. The results bolster the robustness of Baillie–PSW, showing that MR evasion via Arnault constructs does not translate into Lucas evasion, and suggest that exploring beyond Arnault constructions may be required to approach Lucas degeneracy.
Abstract
We present a computational study of 200 composite integers of approximately 350 bits, engineered using the Arnault framework to pass all Miller-Rabin tests up to base 11. Generated at a rate of approximately 20 per hour from a high-throughput construction process producing ~7,700 Carmichael numbers per minute, all samples fail the strong Lucas probable prime test. We introduce the U-bit collapse metric delta = log_2(n) - log_2(U_d mod n) to quantify deviation from the expected uniform distribution of Lucas sequence terms. Analysis reveals minimal collapse values: mean delta = 1.61 bits, median delta = 1.0 bits, maximum delta = 8 bits, with 26% showing no measurable collapse. We analyze correlations with prime residue classes modulo 35, Arnault construction parameters (k,M), and composite bit-sizes. Our results demonstrate that composites engineered for Miller-Rabin resistance exhibit negligible Lucas sequence degeneracy, providing strong empirical evidence for the statistical independence of these two primality test components and supporting the continued robustness of Baillie-PSW-type tests.
