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Statistical process control via $p$-values

Hien Duy Nguyen, Dan Wang

TL;DR

This work proposes a model-free statistical process control framework that monitors processes using sequences of valid $p$-values under the in-control hypothesis via the super-uniformity property. It derives universal lower bounds for the average run length (ARL) and its multialarm generalisation (the $k$-ARL) that hold without dependence assumptions, and sharpens them to $1/\alpha$ and $k/\alpha$ under conditional super-uniformity. The authors introduce EWMA-like charts built from merging functions of $p$-values, providing smoothing without ad hoc control limits, and extend the approach to KS-based nonparametric monitoring and to multivariate directional localisation via closed testing with strong FWER control. The framework offers distribution-free calibration and modular extensions for smoothing and localisation, demonstrated through elementary, KS-based, and multivariate examples, with an accompanying open-source codebase. This p-value charting paradigm enables robust, interpretable SPC across VSI/VSS settings and heavy-tailed data, reducing reliance on parametric models and simulation-based calibration.

Abstract

We study statistical process control (SPC) through charting of $p$-values. When in control (IC), any valid sequence $(P_{t})_{t}$ is super-uniform, a requirement that can hold in nonparametric and two-phase designs without parametric modelling of the monitored process. Within this framework, we analyse the Shewhart rule that signals when $P_{t}\leα$. Under super-uniformity alone, and with no assumptions on temporal dependence, we derive universal IC lower bounds for the average run length (ARL) and for the expected time to the $k$th false alarm ($k$-ARL). When conditional super-uniformity holds, these bounds sharpen to the familiar $α^{-1}$ and $kα^{-1}$ rates, giving simple, distribution-free calibration for $p$-value charts. Beyond thresholding, we use merging functions for dependent $p$-values to build EWMA-like schemes that output, at each time $t$, a valid $p$-value for the hypothesis that the process has remained IC up to $t$, enabling smoothing without ad hoc control limits. We also study uniform EWMA processes, giving explicit distribution formulas and left-tail guarantees. Finally, we propose a modular approach to directional and coordinate localisation in multivariate SPC via closed testing, controlling the family-wise error rate at the time of alarm. Numerical examples illustrate the utility and variety of our approach.

Statistical process control via $p$-values

TL;DR

This work proposes a model-free statistical process control framework that monitors processes using sequences of valid -values under the in-control hypothesis via the super-uniformity property. It derives universal lower bounds for the average run length (ARL) and its multialarm generalisation (the -ARL) that hold without dependence assumptions, and sharpens them to and under conditional super-uniformity. The authors introduce EWMA-like charts built from merging functions of -values, providing smoothing without ad hoc control limits, and extend the approach to KS-based nonparametric monitoring and to multivariate directional localisation via closed testing with strong FWER control. The framework offers distribution-free calibration and modular extensions for smoothing and localisation, demonstrated through elementary, KS-based, and multivariate examples, with an accompanying open-source codebase. This p-value charting paradigm enables robust, interpretable SPC across VSI/VSS settings and heavy-tailed data, reducing reliance on parametric models and simulation-based calibration.

Abstract

We study statistical process control (SPC) through charting of -values. When in control (IC), any valid sequence is super-uniform, a requirement that can hold in nonparametric and two-phase designs without parametric modelling of the monitored process. Within this framework, we analyse the Shewhart rule that signals when . Under super-uniformity alone, and with no assumptions on temporal dependence, we derive universal IC lower bounds for the average run length (ARL) and for the expected time to the th false alarm (-ARL). When conditional super-uniformity holds, these bounds sharpen to the familiar and rates, giving simple, distribution-free calibration for -value charts. Beyond thresholding, we use merging functions for dependent -values to build EWMA-like schemes that output, at each time , a valid -value for the hypothesis that the process has remained IC up to , enabling smoothing without ad hoc control limits. We also study uniform EWMA processes, giving explicit distribution formulas and left-tail guarantees. Finally, we propose a modular approach to directional and coordinate localisation in multivariate SPC via closed testing, controlling the family-wise error rate at the time of alarm. Numerical examples illustrate the utility and variety of our approach.
Paper Structure (18 sections, 15 theorems, 111 equations, 2 figures, 15 tables)

This paper contains 18 sections, 15 theorems, 111 equations, 2 figures, 15 tables.

Key Result

Proposition 1

For each $\alpha\in\left(0,1\right]$, if $\left(P_{t}\right)_{t}$ satisfies (eq:superuniformity), then

Figures (2)

  • Figure 1: Plots of PDFs of the random variables $\tilde{U}_{\lambda,t}$ with initialisation $u_{0}=1/2$, for $\lambda\in\left\{ 0.3,0.5,0.7\right\}$ and $t\in\left\{ 2,3,4\right\}$ along with histograms of 10000 replicates of the corresponding variable.
  • Figure 2: Plots of CDFs of the random variables $\tilde{U}_{\lambda,t}$ with initialisation $u_{0}=1/2$, i.e., $F\left(\alpha\right)=\mathrm{P}_{0}\left(\tilde{U}_{\lambda,t}\le\alpha\right)$, for $\lambda\in\left\{ 0.3,0.5,0.7\right\}$ and $t\in\left\{ 2,3,4\right\}$ (solid line) along with the CDF of $U\sim\mathrm{Unif}\left[0,1\right]$ (dashed line) for $\alpha\le1/2$.

Theorems & Definitions (18)

  • Proposition 1
  • proof
  • Proposition 2
  • Proposition 3
  • Proposition 4
  • Lemma 5
  • Proposition 6
  • Proposition 7
  • Remark 8
  • Proposition 9
  • ...and 8 more