Photoelectron Spectroscopy Study of U-Te Thin Films: A Unified Perspective of Hybridization Effects across Compositions
E. A. Tereshina-Chitrova, S. G. Alex, O. Koloskova, L. Havela, L. Horak, O. Romanyuk, F. Huber, T. Gouder, M. Divis
TL;DR
This work addresses how U–Te hybridization evolves across the uranium telluride series by combining in situ photoelectron spectroscopy on clean, composition-tuned thin films with uniform first-principles calculations. The authors synthesize 10–30 nm U–Te films under ultra-high vacuum with controlled Te:U ratios, perform XPS and UPS to track core-level shifts, line shapes, and valence-band signatures, and compare with FPLO and (L)APW+lo LSDA calculations to quantify charge-transfer and occupancy trends. They observe systematic core-level broadening, binding-energy shifts, and evolving 5f/6d/Te 5p character across the series, including UTe2’s intermediate-valence behavior, which is corroborated by the calculations showing a reduced U-5f occupation with higher Te content. Overall, the study demonstrates that thin-film photoemission provides a robust route to map electronic-structure trends in heavy-element chalcogenides and links surface spectroscopy to bulk-like electronic ground states.
Abstract
Uranium tellurides span magnetic and superconducting ground states, yet systematic electronic-structure information across the U-Te series remains scarce. In this study, we perform photoemission measurements on freshly prepared UxTey thin films covering the range of bulk stoichiometries under ultra-high vacuum (10^-9 Pa), enabling clean surfaces and compositions matching bulk phases, including the celebrated UTe2. X-ray and ultraviolet photoelectron spectroscopy (XPS/UPS) reveal consistent evolution of the U 4f and Te 3d core levels and valence states across the series, in good agreement with the limited bulk data. Supported by uniform ab initio calculations for all U-Te compounds, we identify systematic trends in U-Te hybridization and charge-transfer effects across the series. These results establish thin-film photoemission as a reliable route for mapping electronic-structure trends in tellurides of heavy elements with diverse electronic ground states.
