Smooth SCAD: A Raised Cosine SCAD Type Thresholding Rule for Wavelet Denoising
Radhika Kulkarni, Aluisio Pinheiro, Brani Vidakovic, Abdourrahmane M. Atto
TL;DR
This work addresses wavelet denoising with SCAD-type thresholding by introducing a smooth SCAD rule based on a raised-cosine transition, placing the method inside the continuous SURE framework. The resulting shrinkage function $\rho_{ssc}$ is odd, continuous, and differentiable away from the main threshold, preserving sparsity for small coefficients and near-unbiasedness for large ones. The authors derive an explicit SURE risk, provide a Bayesian interpretation via a smooth nonconvex prior, and develop both global and level-dependent adaptive thresholding strategies with data-driven tuning. Numerical experiments on Donoho–Johnstone benchmarks demonstrate improved performance over classical SCAD and universal thresholding, with practical guidelines for choosing the threshold scale $\lambda$ and the shape parameter $a$.
Abstract
We introduce a smooth variant of the SCAD thresholding rule for wavelet denoising by replacing its piecewise linear transition with a raised cosine. The resulting shrinkage function is odd, continuous on R, and continuously differentiable away from the main threshold, yet retains the hallmark SCAD properties of sparsity for small coefficients and near unbiasedness for large ones. This smoothness places the rule within the continuous thresholding class for which Stein's unbiased risk estimate is valid. As a result, unbiased risk computation, stable data-driven threshold selection, and the asymptotic theory of Kudryavtsev and Shestakov apply. A corresponding nonconvex prior is obtained whose posterior mode coincides with the estimator, yielding a transparent Bayesian interpretation. We give an explicit SURE risk expression, discuss the oracle scale of the optimal threshold, and describe both global and level-dependent adaptive versions. The smooth SCAD rule therefore offers a tractable refinement of SCAD, combining low bias, exact sparsity, and analytical convenience in a single wavelet shrinkage procedure.
