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ATSim3D: Towards Accurate Thermal Simulator for Heterogeneous 3D-IC Systems Considering Nonlinear Leakage and Conductivity

Qipan Wang, Tianxiang Zhu, Yibo Lin, Runsheng Wang, Ru Huang

TL;DR

The paper tackles the challenge of accurate, high-resolution thermal simulation for nonlinear and heterogeneous 3D-ICs by introducing ATSim3D, a global-local framework that couples a compact global model with local finite-volume solves and employs Kirchhoff transformation to handle temperature-dependent conductivity. Through iterative updates of leakage and conductivity and parallelized local computations, ATSim3D achieves significant speedups (average around $40\times$) over rigorous solvers like COMSOL while maintaining low errors (relative $<3\%$, max $<3^\circ\mathrm{C}$) at resolutions up to $4096\times4096$. The approach demonstrates strong performance across Mono3D and TSV-based 3D-ICs, delivering a state-of-the-art high-resolution capability and enabling practical thermal-aware design for next-generation 3D integration. Overall, ATSim3D provides a scalable, multi-scale solution that effectively models nonlinear thermal effects in heterogeneous 3D-ICs with substantial efficiency gains.

Abstract

Thermal simulation plays a fundamental role in the thermal design of integrated circuits, especially 3D ICs. Current simulators require significant runtime for high-resolution simulation, and dismiss the complex nonlinear thermal effects, such as nonlinear thermal conductivity and leakage power. To address these issues, we propose ATSim3D, a thermal simulator for simulating the steady-state temperature profile of nonlinear and heterogeneous 3D IC systems. We utilize the global-local approach, combining a compact thermal model at the global level, and a finite volume method at the local level. We tackle the nonlinear effects with Kirchhoff transformation and iteration. ATSim3D enables local-level parallelization that helps achieve an average speedup of 40x compared to COMSOL, with a relative error <3% and a state-of-the-art resolution of 4096 x 4096, holding promise for enhancing thermal-aware design in 3D ICs.

ATSim3D: Towards Accurate Thermal Simulator for Heterogeneous 3D-IC Systems Considering Nonlinear Leakage and Conductivity

TL;DR

The paper tackles the challenge of accurate, high-resolution thermal simulation for nonlinear and heterogeneous 3D-ICs by introducing ATSim3D, a global-local framework that couples a compact global model with local finite-volume solves and employs Kirchhoff transformation to handle temperature-dependent conductivity. Through iterative updates of leakage and conductivity and parallelized local computations, ATSim3D achieves significant speedups (average around ) over rigorous solvers like COMSOL while maintaining low errors (relative , max ) at resolutions up to . The approach demonstrates strong performance across Mono3D and TSV-based 3D-ICs, delivering a state-of-the-art high-resolution capability and enabling practical thermal-aware design for next-generation 3D integration. Overall, ATSim3D provides a scalable, multi-scale solution that effectively models nonlinear thermal effects in heterogeneous 3D-ICs with substantial efficiency gains.

Abstract

Thermal simulation plays a fundamental role in the thermal design of integrated circuits, especially 3D ICs. Current simulators require significant runtime for high-resolution simulation, and dismiss the complex nonlinear thermal effects, such as nonlinear thermal conductivity and leakage power. To address these issues, we propose ATSim3D, a thermal simulator for simulating the steady-state temperature profile of nonlinear and heterogeneous 3D IC systems. We utilize the global-local approach, combining a compact thermal model at the global level, and a finite volume method at the local level. We tackle the nonlinear effects with Kirchhoff transformation and iteration. ATSim3D enables local-level parallelization that helps achieve an average speedup of 40x compared to COMSOL, with a relative error <3% and a state-of-the-art resolution of 4096 x 4096, holding promise for enhancing thermal-aware design in 3D ICs.
Paper Structure (21 sections, 15 equations, 6 figures, 5 tables)

This paper contains 21 sections, 15 equations, 6 figures, 5 tables.

Figures (6)

  • Figure 1: Temperature difference induced by considering the (a) nonlinear thermal conductivity of Si and (b) nonlinear leakage power in a TSV-based 3D-IC (a $4\times4$ TSV array in the middle, shown by blue circles), compared to the linear case.
  • Figure 2: Cross-section of two 3D-IC structures for (a) a Mono3D-IC with 2 active layers, (b) a two-tier TSV-based 3D-IC.
  • Figure 3: The ATSim3D simulation flow, consisting of iterations between the coarse level and fine level simulation.
  • Figure 4: The hierarchical partition of the whole system. From left to right: whole package, global coarse grid, and local fine grid. The geometric dimensions and unknown variables are indicated.
  • Figure 5: The relation between the error of ATSim3D in TSV3D-IV and (a) the number of iterations, as well as (b) the global grid resolutions, with each coarse grid partitioned into $16\times16$ fine grids.
  • ...and 1 more figures

Theorems & Definitions (1)

  • proof