Topology-Directed Silicide Formation: An Explanation for the Growth of C49-TiSi$_2$ on the Si(100) Surface
Lukas Hückmann, Jonathon Cottom, Jörg Meyer, Emilia Olsson
TL;DR
This study explains why metastable $C49$-TiSi$_2$ forms first at Ti/Si(100) interfaces by showing that surface topology of the reconstructed Si(100) drives Ti adsorption into a TiSi bilayer that templates the $C49$ phase. Through density-functional theory, it reveals that initial Ti adsorption on $c(4\times2)$ Si(100) is site-selective, with strong Ti–Ti pairing in the first subsurface layer lifting Si dimers and enabling bilayer formation. The resulting TiSi bilayer reproduces characteristic motifs of $C49$-TiSi$_2$ and provides a nucleation seed that explains the Stranski–Krastanov growth mode and the preferential formation of $C49$ over $C54$. The work also suggests surface-disruption or refractory overlayers as practical routes to suppress $C49$ formation, guiding more controllable TiSi$_2$ integration in future devices."
Abstract
Designing metal-semiconductor junctions is essential for optimizing the performance of modern nanoelectronic devices. A widely used material is TiSi$_2$, which combines low electronic resistivity with good endurance. However, its multitude of polymorphs continues to pose a challenge for device fabrication. In particular, the naturally occurring formation of the metastable C49-TiSi$_2$ modification remains poorly understood and is problematic due to its unfavorable electronic properties. Based on extensive DFT calculations, we present a comprehensive model of Ti adsorption on Si(100) that highlights the pivotal role of surface topology for the initial stages of the interfacial TiSi$_2$ formation process. We show that the interplay between Si surface dimers, the symmetry of the Si(100) surface, and the incorporation of Ti adsorbates below the surface drives an adsorption pattern that yields a nucleation template for the C49-TiSi$_2$ phase. Our atomistic model rationalizes experimental observations like the Stranski-Krastanov growth mode, the preferential formation of C49-TiSi$_2$ despite it being less favorable than the competing C54 phase, and why disruption of the surface structure restores thermodynamically driven growth of the latter. Ultimately, this novel perspective on the unique growth of TiSi$_2$ will help to pave the way for next-generation electronic devices.
