Disorder-induced strong-field strong-localization in 2D systems
Yi Huang, Sankar Das Sarma
TL;DR
The paper addresses disorder-driven localization in the lowest Landau level under strong magnetic fields, motivated by STM observations of FQHL, WC, and an amorphous solid (AS) in bilayer graphene. It develops a disorder-only heuristic framework using the self-consistent Born approximation to relate the LLL broadening $Γ_{LLL}$ to the cyclotron energy $ħω_c$ and a zero-field broadening $Γ_0$, yielding the scaling $ν_c \sim (Γ_0/(ħω_c))^{1/2}$ (up to constants) and a complementary IRM-based form $ν_c ∼ Γ_0/(ħω_c)$; it also links $ν_c$ to impurity density via $n_i$ and $B$, and presents qualitative phase diagrams showing disorder competing with FQHE and WC to produce an AS. The work emphasizes that disorder is essential to account for the sample-dependent insulating crossover and makes testable predictions, such as a dirtier sample raising $ν_c$, while acknowledging that a full interacting theory would modify but not overturn the central disorder-driven picture. Overall, the paper reframes the LLL phase competition as a disorder-controlled crossover, offering a complementary perspective to purely energetics-based WC vs FQHL studies and highlighting implications for interpreting high-field 2D electron systems.
Abstract
A recent STM experiment in 2D bilayer graphene [Y.-C. Tsui, et al., Nature 628, 287 (2024)], under a strong perpendicular magnetic field, has made a direct observation of the existence of three distinct filling-factor-dependent quantum phases in the lowest Landau level: the incompressible fractional quantum Hall liquid, a crystalline compressible hexagonal Wigner crystal with long-range order and rotational symmetry-breaking, and a random localized solid phase with no spatial order. We argue that the spatially random localized phase at low filling is the recently proposed disorder-dominated strongly localized amorphous "Anderson solid" phase [A. Babber, et al., arXiv:2601.03521], which appears generically at a sample-dependent filling factor.
