Machine-learning enabled characterization of individual ring resonators in integrated photonic lattices
Elizabeth Louis Pereira, Amin Hashemi, Faluke Aikebaier, Hongwei Li, Jose L. Lado, Andrea Blanco-Redondo
TL;DR
The paper tackles the challenge of extracting per-ring parameters in large coupled-ring photonic lattices from global spectral measurements. It introduces supervised learning frameworks that map spectral power distributions to onsite losses and resonance shifts, trained on data from a programmable photonic chip and validated by reconstructing experimental spectra from theory with a 1D-CNN. The two-network workflow—a regression model for $\delta_n$ and $\omega_n$ and an inverse CNN-based spectral regressor—demonstrates high fidelity parameter inference across multiple configurations, enabling scalable, non-invasive calibration and control of complex photonic circuits. This data-driven approach provides a direct link between measured spectra and the effective Hamiltonian, with potential extensions to additional couplings, larger arrays, and closed-loop optimization for automated photonic systems.
Abstract
Accurately determining the underlying physical parameters of individual elements in integrated photonics is increasingly difficult as device architectures become more complex. Inferring these parameters directly from spectral measurements of the system as a whole provides a practical alternative to traditional calibration, allowing characterization of photonic systems without relying on detailed device-specific models. Here, we introduce a supervised machine-learning strategy to learn the onsite losses and resonant frequency shifts of each individual ring in an array of coupled ring resonators from measured spectral power distributions of the whole array. The neural network infers these parameters with high accuracy across multiple experimental configurations. Our methodology provides a scalable and non-invasive method for extracting intrinsic parameters in coupled photonic platforms, paving the way for future development of automated calibration and control methods.
