LaminoDiff: Artifact-Free Computed Laminography in Non-Destructive Testing via Diffusion Model
Tan Liu, Liu Shi, Binghuang Peng, Tong Jia, Xiaoling Xu, Baodong Liu, Qiegen Liu
TL;DR
LaminoDiff tackles artifact-rich Computed Laminography by recasting reconstruction as a conditional diffusion process guided by a physics-informed CT-CL fusion prior. A dual-scale fusion target $x_{fus}$, derived from CT and CL data, provides a high-fidelity supervisory signal that narrows the sim-to-real domain gap while leveraging the CL observation $x_{fdk}$. The method uses a spatially coupled denoiser with time-aware embeddings, conditioned on $x_{fdk}$ and $x_{fus}$, and performs deterministic DDIM reconstruction with classifier-free guidance to enforce data-consistency and structural fidelity. Across simulated and real PCB datasets, LaminoDiff achieves superior artifact suppression and edge preservation, enabling more reliable automated defect recognition in industrial inspection. A remaining challenge is axis anisotropy due to the missing cone; future work includes pseudo-3D spatial constraints or interlayer attention to further isotropize resolution.
Abstract
Computed Laminography (CL) is a key non-destructive testing technology for the visualization of internal structures in large planar objects. The inherent scanning geometry of CL inevitably results in inter-layer aliasing artifacts, limiting its practical application, particularly in electronic component inspection. While deep learning (DL) provides a powerful paradigm for artifact removal, its effectiveness is often limited by the domain gap between synthetic data and real-world data. In this work, we present LaminoDiff, a framework to integrate a diffusion model with a high-fidelity prior representation to bridge the domain gap in CL imaging. This prior, generated via a dual-modal CT-CL fusion strategy, is integrated into the proposed network as a conditional constraint. This integration ensures high-precision preservation of circuit structures and geometric fidelity while suppressing artifacts. Extensive experiments on both simulated and real PCB datasets demonstrate that LaminoDiff achieves high-fidelity reconstruction with competitive performance in artifact suppression and detail recovery. More importantly, the results facilitate reliable automated defect recognition.
