Experimental characterization of the Toffoli gate via channel spectrum benchmarking
D. K. Korliakov, B. I. Bantysh, A. S. Borisenko, I. V. Zalivako, E. O. Kiktenko
TL;DR
This work addresses the challenge of benchmarking quantum gate fidelity when spectral degeneracies and off-diagonal noise hinder standard CSB analyses. It extends CSB with a 6-term noisy-eigenvalue model and introduces FEI, an interval fidelity estimate that remains informative under degeneracy. Numerical simulations on a three-qubit Toffoli gate show that FEI midpoints closely approximate true fidelity and outperform the original 4-term approach, while experiments on a trapped-ion platform compare qubit and qutrit Toffoli implementations and reveal leakage in the qutrit path. The results demonstrate a SPAM-robust, degeneracy-tolerant benchmarking framework with potential applicability across platforms and gate sets.
Abstract
Channel spectrum benchmarking (CSB) provides a robust framework for characterizing quantum gate fidelities while remaining insensitive to state preparation and measurement (SPAM) errors. Yet, current CSB implementations encounter fundamental challenges when reconstructing noisy eigenvalues, particularly in the presence of spectral degeneracies and off-diagonal noise components in the target gate's eigenbasis. These issues become especially pronounced in the strong noise regime for gates with fidelities around $90\%$. To address these limitations, we introduce an extended CSB model together with a fidelity estimate interval (FEI) -- an interval-valued estimate of the target gate fidelity. Numerical simulation demonstrates that FEI remains sufficiently narrow, with its midpoint reliably approximating the true fidelity. We further validate the protocol on a trapped-ion quantum processor by benchmarking two implementations of the three-qubit Toffoli gate. The results reveal a clear advantage of the qutrit-based implementation over its qubit-based counterpart.
