Sub-nanometer 3D morphometric precision of polarisation-resolved wide-field optical extinction microscopy determines the roundness of individual gold nanospheres
Lukas M Payne, Furqan Alabdullah, Paola Borri, Wolfgang Langbein
TL;DR
The study expands polarization-resolved extinction microscopy by adding radial polarization to the condenser back focal plane, enabling direct probing of NP axial geometry for 3D morphometry. By measuring extinction cross-sections across six wavelengths and both linear and radial polarisations, the authors solve a multi-parameter inverse problem using a Rayleigh–Gans ellipsoid model with a size-dependent surface damping term and a rotated polarizability tensor. The results on 30 nm ultra-uniform gold nanospheres achieve sub-nanometer precision in the ellipsoid semiaxes and sub-5% precision in aspect ratios, with an estimated diameter accuracy improved further when retardation is included via Mie theory. The Olmon permittivity dataset with surface damping $g=1.8$ provides the best fits, highlighting the method’s sensitivity to nanoscale material properties and its potential as a high-throughput, TEM-complementary morphometry tool, capable of probing nonlocal and retardation effects at the nanoscale.
Abstract
Quantitative polarisation-resolved optical extinction microscopy of individual plasmonic nanoparticles has recently been introduced as a powerful tool to characterise the nanoparticle's morphology with a precision comparable to electron microscopy, while using a simple optical microscope [Nanoscale 12, 16215 (2020)]. Here we extend the technique by adding measurements for radial polarisation in the condenser back focal plane, probing plasmonic resonances polarised in axial direction. The combined linear and radial polarisation measurements provide a significantly enhanced precision of the retrieved 3D morphology, as we show on defect-free ultra-uniform gold nanospheres of 30 nm nominal diameter characterised by transmission electron microscopy. The measured cross-sections are quantitatively described by an ellipsoid model, determining the three semi-axes and rotation angles by fitting the measurements. Evaluation the distribution of the fit error across the set of measured particles, the material permittivity dataset and surface damping parameter g providing the best fit are found to be the single crystal dataset by Olmon et al. [Phys. Rev. B 86, 235147 (2012)] and g = 1.8, respectively. The precision of the retrieved aspect ratio is below 5%, and all three ellipsoidal semi-axes are determined with an impressive precision of 0.25 nm. Notably, corrections to the Rayleigh-Gans ellipsoid model due to retardation are significant even though the particle diameters are more than an order of magnitude smaller than the wavelength, and taking them into account improves the accuracy to below a nanometer.
