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Pixel response characterization of the ARCADIA Fully Depleted MAPS

C. Pantouvakis, M. Rignanese, T. Zenger, S. Ciarlantini, A. Zingaretti, P. Azzi, C. Bonini, D. Chiappara, S. Mattiazzo, D. Pantano, J. Wyss, A. Apresyan, N. Bacchetta, L. Bolla, A. Hayrapetyan, C. Pena, N. Salvador, S. Xie, I. Zoi, D. Falchieri, S. Garbolino, L. Pancheri, A. Paternò, A. Rivetti, M. Rolo, R. Santoro, P. Giubilato

TL;DR

The paper presents the first laboratory characterization of the ARCADIA MD3 fully-depleted MAPS prototype, focusing on threshold uniformity, energy calibration, and charge collection efficiency. It employs test-pulse injections, $^{55}$Fe measurements, monochromatic fluorescence X-rays, and infrared laser scans to establish per-pixel calibrations, DAC-to-electron conversion, and uniform charge-collection performance. Key findings include threshold dispersions below ~8% around ~$1.7\times10^{3}$ e−, a robust calibration curve linking injected charge to electrons, and near-uniform full-area efficiency with quantifiable center-to-edge effects due to diffusion. These results position ARCADIA as a viable, low-mass, low-noise sensor technology for future high-energy physics detectors, with demonstrated feasibility of thinning to ~20 μm and potential for high-granularity tracking at modest power consumption.

Abstract

Monolithic Active Pixel Sensors (MAPS) achieved widespread use in several scientific applications, thanks to their properties, such as low material budget and high granularity. The ARCADIA INFN project developed a Fully-Depleted MAPS (FD-MAPS), using a modified LFoundry 110 nm CIS process. This work presents the first laboratory characterization of the ARCADIA MD3 prototype. Measurements include threshold uniformity studies using both test-pulse injection and a $^{55}$Fe source, as well as threshold and noise calibration achieved thanks to monochromatic X-ray sources. Ultimately, charge-collection efficiency is evaluated using an infrared laser setup.

Pixel response characterization of the ARCADIA Fully Depleted MAPS

TL;DR

The paper presents the first laboratory characterization of the ARCADIA MD3 fully-depleted MAPS prototype, focusing on threshold uniformity, energy calibration, and charge collection efficiency. It employs test-pulse injections, Fe measurements, monochromatic fluorescence X-rays, and infrared laser scans to establish per-pixel calibrations, DAC-to-electron conversion, and uniform charge-collection performance. Key findings include threshold dispersions below ~8% around ~ e−, a robust calibration curve linking injected charge to electrons, and near-uniform full-area efficiency with quantifiable center-to-edge effects due to diffusion. These results position ARCADIA as a viable, low-mass, low-noise sensor technology for future high-energy physics detectors, with demonstrated feasibility of thinning to ~20 μm and potential for high-granularity tracking at modest power consumption.

Abstract

Monolithic Active Pixel Sensors (MAPS) achieved widespread use in several scientific applications, thanks to their properties, such as low material budget and high granularity. The ARCADIA INFN project developed a Fully-Depleted MAPS (FD-MAPS), using a modified LFoundry 110 nm CIS process. This work presents the first laboratory characterization of the ARCADIA MD3 prototype. Measurements include threshold uniformity studies using both test-pulse injection and a Fe source, as well as threshold and noise calibration achieved thanks to monochromatic X-ray sources. Ultimately, charge-collection efficiency is evaluated using an infrared laser setup.

Paper Structure

This paper contains 12 sections, 3 equations, 15 figures.

Table of Contents

  1. Introduction
  2. Chip overview
  3. Threshold uniformity
  4. Test pulse scan
  5. 55Fe scan
  6. Energy calibration
  7. Fluorescence X-rays
  8. Threshold and noise calibration
  9. Charge collection efficiency
  10. Experimental Setup
  11. Results
  12. Conclusions

Figures (15)

  • Figure 1: ARCADIA MD3 chip bonded on the PCB da2025arcadia.
  • Figure 2: ARCADIA MD3 architecture organization da2025arcadia.
  • Figure 3: Single pixel S-curve fit: for threshold > $\upmu$, the pixel never responds to test pulse injection; for threshold around $\upmu$, pixel response rate starts to increase up to a region where the rate is always 100%. The noise region, i.e. where the pixel response rate is above 100%, is entered when the threshold crosses the preamplifier baseline, causing the discriminator to trigger on noise. For even lower thresholds, the discriminator is always high and the pixel does not respond to any injection.
  • Figure 4: Pixels S-curve middle point map \ref{['fig:heatmap_TP']} of threshold scan with 9 a.u. injected charge. Black entries are pixels that do not show a S-curve behavior in the scan range of [33, 63] DAC, hence lacking any actual middle point. Distribution of middle point values \ref{['fig:thr_distr_TP']} for the subsample of pixels not affected by the injection issue, for 6 a.u. and 9 a.u. charge injected.
  • Figure 5: Baseline map \ref{['fig:heatmap_baseline']} and baseline distribution \ref{['fig:baseline_distr_TP']} obtained from test pulse measurements.
  • ...and 10 more figures