Hybrid Machine-Learning Particle Identification for the ePIC Proximity-Focusing RICH
D. H. Dongwi, C. -J. Naïm, L. Rhode, A. Deshpande
TL;DR
This work tackles particle identification in the pfRICH proximity-focusing RICH detector for the ePIC experiment at the Electron-Ion Collider by integrating CNN-based pattern recognition with an XGBoost classifier in a Geant4-based simulation framework. The hybrid model processes per-event Cherenkov-hit images alongside beam-kinematic features to deliver high per-class efficiencies (e.g., protons ~98%, kaons ~97%) and separation powers exceeding three-sigma up to ~12 GeV/$c$ for relevant PID pairs. The key contribution is a practical, high-performance PID pipeline that leverages both image-like detector information and traditional kinematics, with strong interpretability evidenced by feature-importance analyses showing dominant physical features (e.g., $\theta_c$) and meaningful CNN contributions. This approach demonstrates the viability of ML-enhanced Cherenkov detectors for next-generation EIC experiments and provides a adaptable framework for broader detector-PID integration within the ePIC software ecosystem.
Abstract
We present a machine-learning-based particle-identification study for the proximity-focusing Ring Imaging Cherenkov (pfRICH) detector of the ePIC experiment at the Electron-Ion Collider. Operating in the backward region ($-3.5 \lesssim η\lesssim -1.5$), the pfRICH is designed to achieve at least $3σ$ separation among pions, kaons, and protons up to $7,\mathrm{GeV}/c$ for Semi-Inclusive Deep Inelastic Scattering measurements. Using a standalone Geant4 simulation of the pfRICH, we develop a hybrid machine-learning approach that combines convolutional neural-network-based feature extraction with gradient-boosted decision-tree classifiers. This method significantly enhances Cherenkov-ring pattern recognition and improves particle-separation performance, demonstrating the effectiveness of hybrid machine-learning techniques for next-generation Cherenkov detectors at the EIC.
