Advanced microwave SQUID multiplexer model incorporating readout power effects and Josephson junction inhomogeneities
Martin Neidig, Mathias Wegner, Sebastian Kempf
TL;DR
The paper addresses the limited parameter range of existing μMUX models by introducing a numerical framework that solves rf‑SQUID dynamics for $β_\mathrm{L}<1$ with arbitrary current–phase relations. It demonstrates substantially improved agreement with experimental data at higher readout powers and across a broader design space than previous analytical models. A key advance is the inclusion of a mesoscopic barrier inhomogeneity model, which reveals that junction barrier variations, while qualitatively similar to increasing $β_\mathrm{L}$, imprint distinct signatures on the resonance response and must be accounted for accurate characterization. The work provides a practical tool for designing and optimizing next‑generation cryogenic detector readouts and is compatible with non‑tunneling junction devices, offering enhanced predictive power for μMUX performance.
Abstract
We present an advanced model for describing the readout power dependence of the resonance characteristics of a microwave SQUID multiplexer. Our model proves valid for SQUID screening parameters up to $β_\mathrm{L}<1$, hence covering the full range of practically relevant design parameters. We demonstrate that our model significantly improves agreement with experimental data compared to the existing models, thereby enabling optimization beyond the previously accessible parameter space. Moreover, our model supports non-sinusoidal current-phase relations of the rf-SQUID's Josephson junction, allowing, for the first time, for the modeling of devices based on Josephson tunnel junctions with inhomogeneous tunnel barriers. We show that the effects of such inhomogeneities are qualitatively similar to, yet distinct from, those of the screening parameter, making their inclusion essential for accurate characterization. Incorporating these effects yields great improved agreement with measurements, even at readout power conditions well beyond typical operating parameters.
