A Distribution Testing Approach to Clustering Distributions
Gunjan Kumar, Yash Pote, Jonathan Scarlett
TL;DR
This work tackles the problem of clustering a set of distributions into two groups with identical members in each group, where distributions from different groups are ε-far in total variation. It introduces a two-stage, distribution-testing-based approach that first finds exemplar distributions from each cluster and then classifies the remaining distributions, achieving tight (up to a log k factor) upper and lower bounds on sample complexity across regimes defined by n, k, r, and ε. The results distinguish between the one-known-one-unknown and the both-unknown cases, employing tools from distribution testing (identity/equivalence/uniformity), likelihood-free hypothesis testing (LFHT), and unequal-sample testing to derive both the algorithms and corresponding lower bounds. The findings illuminate the fundamental role of cluster-size r and demonstrate that adaptive two-stage strategies are nearly optimal for finite-sample, constant-error clustering of distributions. These insights advance practical finite-sample clustering of distributions and connect distribution testing techniques to clustering challenges in unsupervised learning and bandit-inspired settings.
Abstract
We study the following distribution clustering problem: Given a hidden partition of $k$ distributions into two groups, such that the distributions within each group are the same, and the two distributions associated with the two clusters are $\varepsilon$-far in total variation, the goal is to recover the partition. We establish upper and lower bounds on the sample complexity for two fundamental cases: (1) when one of the cluster's distributions is known, and (2) when both are unknown. Our upper and lower bounds characterize the sample complexity's dependence on the domain size $n$, number of distributions $k$, size $r$ of one of the clusters, and distance $\varepsilon$. In particular, we achieve tightness with respect to $(n,k,r,\varepsilon)$ (up to an $O(\log k)$ factor) for all regimes.
