Finding the Maximal Contrast of Two Elliptical Gaussian Mode Beams with Aligned Ellipticities
Mark Zhu, Sina M. Koehlenbeck, Edgard Bonilla, Brian Lantz
TL;DR
The paper addresses the problem of quantifying the maximal interferometric contrast between two aligned elliptical Gaussian beams by deriving a closed-form expression for $C$ in terms of beam powers, waists $w_{0x}, w_{0y}$, and radii of curvature $R_x, R_y$. The approach models the interference of two elliptical Gaussians, uses Fresnel-type integrals to obtain a rigorous $C$, and validates the theory with a free-space Michelson interferometer, measuring ten beam parameters to compute a theoretical limit $C_{\mathrm{theory}} = 0.968 \pm 0.005$ and an experimental maximum $C_{\mathrm{exp}} = 0.950 \pm 0.007$. The results demonstrate that the analytical formula is a practical tool for modeling and optimizing elliptical-beam interferometers, while also highlighting real-world factors such as misalignment and non-Gaussian features that can reduce achievable contrast. This work provides a concrete framework for predicting and maximizing fringe visibility in high-precision optical measurements.
Abstract
Interferometric contrast is a key factor limiting the sensitivity of precision optical measurements, including the laser interferometers used in gravitational-wave detection. While standard formulas describe the interference of circular Gaussian beams, many real systems use beams with elliptical cross sections, where differing waists and radii of curvature can reduce fringe visibility. This paper derives an analytic expression for the maximum contrast achievable between two aligned elliptical Gaussian beams, written entirely in terms of their geometric and power parameters. We then test the formula using a free-space Michelson interferometer in which all beam parameters are independently measured through beam profiling and nonlinear fitting. In our experiment, the predicted maximum contrast was 0.968 while the experimentally optimized value was 0.950. The small discrepancy is consistent with expected imperfections such as beam rotation, mode mismatch, and non-Gaussian aberrations. This work provides a practical tool for modeling and optimizing elliptical-beam interferometers.
