Passive Silicon Nitride On-Chip Polarimetry: Precise Polarization Detection with Imperfect Components
Christoph Stockinger, Natale G. Pruiti, Isaac Tribaldo, Jörg S. Eismann, Marc Sorel, Peter Banzer
TL;DR
The paper tackles the challenge of measuring polarization of visible free-space light with compact, integrable devices. It proposes a fully passive silicon nitride PIC that maps polarization into on-chip intensity measurements using a compact 2D grating coupler and passive interferometers, enabling single-shot polarization reconstruction. A calibration framework estimates imperfect parameters, including $\alpha$, $x_i$, and $t_{ij}$, to correct for non-ideal polarization splitting and phase behavior. Experimental results across 50 polarization states yield strong agreement with theory, achieving $\Delta S_{RMS} = 0.028$, and the approach is compatible with CMOS scaling and potential array implementations for spatially resolved polarimetry.
Abstract
Polarization is a fundamental property of light that carries distinct and valuable information. Consequently, its precise measurement is crucial for numerous applications, including biomedical imaging, remote sensing, and optical communication. Since polarization cannot be measured directly, it is typically inferred by converting it into intensity signals using dedicated optical elements. Conventional approaches, however, predominantly rely on bulky optical components, leading to considerably high fabrication costs and limited integration density. Here, we introduce a passive photonic integrated circuit capable of precisely determining the polarization state of visible free-space light. An silicon nitride on-chip architecture employing a compact polarization-splitting grating coupler and a set of passive interferometers encodes the polarization information into intensity signals, allowing conventional detectors to accurately reconstruct the polarization state. With increasing compactness of photonic components, however, susceptibility to fabrication tolerances as well as intrinsic design constraints increases, potentially leading to non\-/ideal behaviour. To address this, we introduce a robust calibration procedure that enables precise measurements even in the presence of imperfections. The chip design, combined with the calibration procedure, offers a robust, small-footprint, and high-speed approach to polarimetry, enabling a wide range of applications.
