The magnetic inverse problem for two stacked layers of sources
Michael T. M. Woodley, Thomas Coussens, William Evans, Matthew Withers, Leigh Page, Daniel Nightingale, Denilson Nicolau, Gary Kendall, Fedja Orucevic, Peter Kruger
TL;DR
The paper tackles reconstructing electronic current densities in a two-layer stack from magnetic-field measurements taken on planes above and below the stack. It develops a Fourier-domain framework using the Biot-Savart law and a continuation matrix to enable exact, non-invasive recovery of layer currents, demonstrated via numerical simulation. The approach highlights potential applications in battery cells and other layered devices, and sets the stage for generalizing to more layers with regularization or invasive measurement schemes. Overall, it provides a principled method for multi-layer current imaging with non-destructive diagnostic potential.
Abstract
We present calculations that reconstruct electronic current densities in two stacked layers at known depths, using magnetic field data. Solving this inverse problem requires knowledge of the magnetic field in two planes -- one above both current layers, one below -- corresponding to non-invasive measurements of the field. We corroborate the accuracy of current density reconstruction from the resulting system of equations using a numerical simulation. This method is anticipated to be applicable to non-destructive current imaging for quality assurance in a range of applications featuring two-layer geometries, including printed circuit boards, capacitors, fuel cells, and battery cells; we focus particularly here on battery cells, due to their rapidly increasing relevance for automotive applications. This method also offers a framework for generalising the model to more than two layers in future work.
