Improved Ising Meson Spectroscopy Simulation on a Noisy Digital Quantum Device
Hao-Ti Hung, Isabel Nha Minh Le, Johannes Knolle, Ying-Jer Kao
TL;DR
This work addresses extracting $E_8$-related meson spectra from real-time dynamics of the 1D transverse-field Ising model on a noisy quantum device. It compares two error-resilient strategies: direct first-order Trotter evolution with native gates and tensor-network–based Riemannian circuit compression to fixed-depth circuits, both coupled with error mitigation. Using the IBM Quantum device ibm_torino, the central-spin magnetization dynamics are Fourier-transformed to reveal peaks corresponding to $E_8$ mass ratios, validated against classical benchmarks and tensor-network results. The results show that, with circuit compression and mitigation, essential $E_8$ spectral features can be observed on NISQ hardware, highlighting a path to probing nontrivial quantum field theory phenomena with limited circuit depth. The work also outlines future extensions to quench dynamics in related models such as XXZ and the massive Thirring model.
Abstract
The transverse-field Ising model serves as a paradigm for studying confinement and excitation spectra, particularly the emergence of $E_8$ symmetry near criticality. However, experimentally resolving the Ising meson spectroscopy required to verify these symmetries is challenging on near-term quantum hardware due to the depth of circuits required for real-time evolution. Here, we demonstrate improved spectroscopy of confined excitations using two distinct error-resilient circuit construction techniques on the IBM Torino device: first-order Trotter decomposition utilizing native fractional gates, and a tensor-network-based circuit compression via Riemannian optimization. By analyzing the Fourier spectrum of error-mitigated time-series data, we successfully identify key signatures of $E_8$ symmetry despite hardware noise. These results validate the viability of both circuit compression and hardware-efficient compilation for probing complex topological phenomena on NISQ devices.
