A Direct Calibration Algorithm for ADC Interleaving
Chi-kwan Chan, Hina Suzuki, David Forbes, Andrew Thomas West, Arash Roshanineshat, Daniel P. Marrone, Amy Lowitz
TL;DR
The paper tackles interleaving-induced mismatches in ADC arrays, specifically phase delay $\tau_p$, gain $\gamma_p$, and offset $\alpha_p$, which degrade high-bandwidth signal reconstruction. It introduces a direct, Fourier-based calibration method that uses a sinusoidal reference $f(t) = A\cos(\Omega t)$ to extract mismatch parameters from the frequency-domain samples, yielding closed-form relationships between the observed Fourier components and the unknowns. Key results include $\tilde{\mathcal{R}}_m = \sum_{p=0}^{P-1} e^{-2\pi i m p / P} \Gamma_p$ with $\Gamma_p = \gamma_p e^{i \Omega \tau_p}$ and $\tilde{\mathcal{A}}_m = \sum_{p=0}^{P-1} e^{-2\pi i m p / P} \alpha_p$, enabling recovery via inverse DFT. The proposed algorithm operates with complexity $\mathcal{O}(N \min(\log N, P))$, is easily implementable in hardware or software, and is scalable to large numbers of interleaved ADCs, making it well-suited for real-time calibration in VLBI and related high-throughput sensing domains.
Abstract
We introduce a novel direct calibration algorithm to address phase delay, gain, and offset mismatches in Analog-to-Digital Converter (ADC) time interleaving systems. These mismatches, common in high-speed data acquisition, degrade system performance and signal integrity, particularly in applications such as radio astronomy and very long baseline interferometry (VLBI). Our proposed algorithm uses a sinusoidal reference signal and Fourier analysis to isolate and correct each type of mismatch, providing a computationally efficient solution. Extensive numerical simulations validate the algorithm's effectiveness and demonstrate its ability to significantly enhance signal reconstruction accuracy compared to existing methods. This work provides a robust and scalable solution for maintaining signal fidelity in interleaved ADC systems and has broad applications in fields that require high-speed data acquisition.
