Table of Contents
Fetching ...

Quantum Coherence of Rare-Earth Ions in Heterogeneous Photonic Interfaces

Henry C. Hammer, Hassan A. Bukhari, Yogendra Limbu, Brett M. Wasick, Christopher Rouleau, Michael E. Flatté, Durga Paudyal, Denis R. Candido, Ravitej Uppu

Abstract

Harnessing rare-earth ions in oxides for quantum networks requires integration with bright emitters in III-V semiconductors, but local disorder and interfacial noise limit their optical coherence. Here, we investigate the microscopic origins of the ensemble spectrum in Er$^{3+}$:TiO$_2$ epitaxial thin films on GaAs and GaSb substrates. Ab initio calculations combined with noise-Hamiltonian modeling and Monte Carlo simulations quantify the effects of interfacial and bulk spin noise and local strain on erbium crystal-field energies and inhomogeneous linewidths. Photoluminescence excitation spectroscopy reveals that Er$^{3+}$ ions positioned at increasing distances from the III-V/oxide interface produce a systematic blue shift of the $Y_1\rightarrow Z_1$ transition, consistent with strain relaxation predicted by theory. Thermal annealing produces a compensating redshift and linewidth narrowing, isolating the roles of oxygen-vacancy and gallium-diffusion noise. These results provide microscopic insight into disorder-driven decoherence, offering pathways for precise control of hybrid quantum systems for scalable quantum technologies.

Quantum Coherence of Rare-Earth Ions in Heterogeneous Photonic Interfaces

Abstract

Harnessing rare-earth ions in oxides for quantum networks requires integration with bright emitters in III-V semiconductors, but local disorder and interfacial noise limit their optical coherence. Here, we investigate the microscopic origins of the ensemble spectrum in Er:TiO epitaxial thin films on GaAs and GaSb substrates. Ab initio calculations combined with noise-Hamiltonian modeling and Monte Carlo simulations quantify the effects of interfacial and bulk spin noise and local strain on erbium crystal-field energies and inhomogeneous linewidths. Photoluminescence excitation spectroscopy reveals that Er ions positioned at increasing distances from the III-V/oxide interface produce a systematic blue shift of the transition, consistent with strain relaxation predicted by theory. Thermal annealing produces a compensating redshift and linewidth narrowing, isolating the roles of oxygen-vacancy and gallium-diffusion noise. These results provide microscopic insight into disorder-driven decoherence, offering pathways for precise control of hybrid quantum systems for scalable quantum technologies.

Paper Structure

This paper contains 1 equation, 5 figures.

Figures (5)

  • Figure 1: (a) Schematic of the synthesized heteroepitaxial Er$^{3+}$:TiO$_2$ thin film on III-V substrates featuring an undoped buffer layer grown under high vacuum. Photoluminescence excitation (PLE) spectra of the $Y_1\rightarrow Z_1$ transition in Er$^{3+}$ doped into the rutile (b) and anatase (c) phase thin films grown on GaAs and GaSb substrates.
  • Figure 2: (a) Schematic of the GaX-TiO$_{2}$ heterostructure indicating Er ions (cyan) at interfacial distance $d$ that interact with Ga spins (brown) that diffuse into TiO$_2$ with characteristic length $\lambda$ and oxygen vacancies (red) $V_\textrm{O}$. (b) Illustration of linewidth broadening arising from the fluctuating magnetic fields $\delta B_z(t)$ on the $Y_{1}\rightarrow Z_{1}$ transition of the crystal-field-split energy levels of Er$^{3+}$. (c) Spectral noise density $S_z(d)$ due to Ga nuclear spins as a function of distance $d$, compared to the expected $d^{-3}$ (gray dashed) and $d_c^{-3}e^{-(d-d_c)/\lambda}$ (red dotted) dependencies with $\lambda=4$ nm and $d_c=0.35$ nm. Insets show a schematic of Ga spin density distributions near and far from the interface. (d) Distance-dependent $Y_{1}\rightarrow Z_{1}$ transition frequency $\omega(d)$, illustrating the influence of interfacial strain. (e) Illustration of the asymmetric inhomogeneous lineshape resulting from the interplay between strain and distance-dependent individual Er$^{3+}$ homogeneous linewidths.
  • Figure 3: (a) Schematic of the selectively-doped Er$^{3+}$:TiO$_2$ thin film on GaAs featuring a $2~nm$-thin doped layer introduced at an interfacial distance $d$. (b) PLE spectra around the $Y_1\rightarrow Z_1$ transition of Er$^{3+}$ ions in such annealed thin films exhibit significant frequency shifts due to distance-dependent strain in the thin film. (c) Frequency shift of the $Y_1\rightarrow Z_1$ transition ($\nu_\delta$) before and after annealing, relative to the measured frequency in uniformly-doped samples ($\nu_\textrm{bulk}$), highlights the interplay between strain and oxygen-vacancy contributions.
  • Figure 4: (a) Effect of in-plane compressive and tensile strain (with 1% fixed $c$-axis compression) on crystal field energy levels. (b) Defect formation energy of Er-doped TiO$_2$ with (blue) and without (red) $V_O$ at the next nearest neighbor. (c) Spin density of neutral Er-doped A-TiO$_2$ ($q=0$). The large spin density on Er arises from its $\sim$3 $\mu_B$ spin moment (Er$^{3+}$), while nearby O atoms show small induced spin densities due to Er-4f and O-$2p$ hybridization (see Supplemental Material).
  • Figure 5: (a) Inhomogeneous linewidth $\Gamma_{inh}$ as a function of distance from GaX-TiO$_2$ interface before and after annealing of the $\delta$-doped $\mathrm{A\text{-}TiO_2}$ samples. (b) Experimental and simulated lineshape for the $Y_{1}\rightarrow Z_{1}$ transition in $\mathrm{A-TiO_{2}}$. (c) Experimental and Monte Carlo–simulated lineshape for the $Y_{1}\rightarrow Z_{1}$ transition in $\mathrm{R-TiO_{2}}$.