Ab initio modeling of resonant inelastic x-ray scattering from Ca2RuO4
D. A. Kukusta, L. V. Bekenov, P. F. Perndorfer, D. V. Vyalikh, P. A. Buczek, A. Ernst, V. N. Antonov
TL;DR
This work develops and applies an ab initio, fully relativistic DFT-based framework (GGA+$U$ with SOC in a Dirac LMTO basis) to model RIXS at the Ru $L_3$ and O $K$ edges in Ca$_{2}$RuO$_{4}$. It reveals a SOC-induced $t_{2g}$ split into $J_{ m eff}=3/2$ and $J_{ m eff}=1/2$ manifolds, with a gap that emerges upon electronic correlations, consistent with a mixed Slater–Mott insulating character. The RIXS spectra, including intra-$t_{2g}$ and higher-energy transitions, are best reproduced with $U_{ m eff}=0.5$ eV, and the calculations capture polarization and incident-energy dependences, while indicating possible excitonic contributions not captured by one-particle theory. Overall, the study provides a rigorous, first-principles pathway to model and interpret RIXS in complex 4$d$ oxides and lays the groundwork for extending this approach to other correlated materials.
Abstract
The single-layered perovskite Ca$_2$RuO$_4$, characterized by a 4$d^4$ electron configuration, has been studied from first principles using density functional theory (DFT) using the generalized gradient approximation, with inclusion of strong on-site Coulomb interactions and spin-orbit coupling (GGA+SO+$U$), in the framework of the fully relativistic, spin-polarized Dirac linear muffin-tin orbital (LMTO) band-structure method. This approach enabled a comprehensive investigation of the electronic structure of Ca$_2$RuO$_4$ through the modeling of relevant spectra obtained from synchrotron-based techniques widely used to probe electronic properties, with a primary focus on resonant inelastic X-ray scattering (RIXS) at the Ru $L_3$ and O $K$ edges. The calculated spectra were thoroughly analyzed with available experimental data reported in the literature. The good agreement between our results and experimental observations for Ca$_2$RuO$_4$ enables a conclusive interpretation of key features in the spectra obtained from the aforementioned techniques. Consequently, this enables us to describe its electronic properties and to establish a solid theoretical approach suitable for routine modeling of spectra, particularly from RIXS, aimed at characterizing the electronic structure and properties of similar or more complex strongly correlated, technologically relevant materials.
