Predicting Grain Growth in Polycrystalline Materials Using Deep Learning Time Series Models
Eliane Younes, Elie Hachem, Marc Bernacki
TL;DR
This work addresses the predictive challenge of grain growth in polycrystalline materials by combining mean-field descriptors derived from validated TRM simulations with deep time-series forecasting models. It systematically compares RNN, LSTM, TCN, and Transformer architectures for recursive forecasting of evolving grain-size distributions, finding that the LSTM offers the best accuracy and long-horizon stability. The approach delivers substantial speed-ups over full-field simulations and maintains physical fidelity, making it well suited for real-time digital-twin and process-optimization workflows. The study highlights practical guidelines, such as a 30-bin histogram representation and an 80:15:5 data split, and points to future work including non-isothermal conditions and second-phase particle effects to extend realism.
Abstract
Grain Growth strongly influences the mechanical behavior of materials, making its prediction a key objective in microstructural engineering. In this study, several deep learning approaches were evaluated, including recurrent neural networks (RNN), long short-term memory (LSTM), temporal convolutional networks (TCN), and transformers, to forecast grain size distributions during grain growth. Unlike full-field simulations, which are computationally demanding, the present work relies on mean-field statistical descriptors extracted from high-fidelity simulations. A dataset of 120 grain growth sequences was processed into normalized grain size distributions as a function of time. The models were trained to predict future distributions from a short temporal history using a recursive forecasting strategy. Among the tested models, the LSTM network achieved the highest accuracy (above 90\%) and the most stable performance, maintaining physically consistent predictions over extended horizons while reducing computation time from about 20 minutes per sequence to only a few seconds, whereas the other architectures tended to diverge when forecasting further in time. These results highlight the potential of low-dimensional descriptors and LSTM-based forecasting for efficient and accurate microstructure prediction, with direct implications for digital twin development and process optimization.
