Millimeter-Wave Transmission-Line Reflectionless Filters
Matthew A. Morgan, Matt Bauwens, Seng Loo, Miho Hunter, Tod A. Boyd, Robert M. Weikle
TL;DR
This work tackles the problem of achieving reflectionless, absorptive filtering at millimeter wavelengths by enforcing the condition $s_{ii}(f)=0$ in a transmission-line topology. It implements two high-frequency filters centered at $100\text{ GHz}$ and $230\text{ GHz}$ using Lange-interdigital coupled lines on an Alumina substrate with a thin-film CPW layout, designed around the parameter $z_x$ (e.g., $z_x=\sqrt{2}$). Fabrication proceeds on a $150\text{ mm}$ alumina wafer with multiple metal layers and TaN resistors, and wafer-probe measurements are performed up to $500\text{ GHz}$ with TRL calibration. The results push the operating frequency of reflectionless filters higher than previously reported, achieving compact footprints and good agreement with EM simulations, while highlighting practical challenges from substrate dispersion and fabrication tolerances.
Abstract
We report on the development of transmission-line reflectionless filters operating with passbands at 100 GHz and 230 GHz, and stopband absorption up to 500 GHz, the highest operating frequencies yet recorded for such filters. The designs are based on a previously reported mathematical solution to the reflectionless condition, now successfully implemented for the first time, using an advanced thin-film fabrication process on Alumina substrates. Sub-millimeter wave wafer probe measurements show good agreement with theory.
