Mock Observations for the CSST Mission: CPI-C -- Instrument Simulation
Gang Zhao, Yiming Zhu, Jiangpei Dou, Yili Chen, Zhonghua Lv, Bingli Niu, Zhaojun Yan, Bo Ma, Ran Li
TL;DR
This work presents CPISM, an end-to-end simulator for the CPI-C instrument on CSST, enabling development and validation of the CPI-C data-processing pipeline and scientific performance. It combines an optics module (apodized pupil filter, DM, focal plane mask) with a broadband high-contrast framework powered by Electric Field Conjugation to form a $10^{-8}$ dark hole, and a detailed EMCCD camera model that spans photon collection, transfer, multiplication, and readout while incorporating realistic noise sources. AGamma-based EM multiplication model and a calibrated EM gain–voltage relation improve simulation efficiency without sacrificing essential statistics, facilitating rapid generation of realistic CPI-C images. The tool outputs data products closely resembling real observations, supporting target selection, pipeline testing, and preparation for future CPI-C science cases.
Abstract
To support the development of the data processing pipeline and the scientific performance assessment for the Cool Planet Imaging Coronagraph (CPI-C) on the Chinese Space Station Survey Telescope (CSST), we have developed the end-to-end instrument simulation program, CPISM. This paper details the core modules of CPISM that simulate the CPI-C instrument, focusing on the simulation of the high-contrast imaging optical system and the visible-band science camera. We modeled key optical components, such as the transmission apodizing filter, the wavefront corrector, and the focal plane mask using the HCIPy package. A $10^{-8}$ contrast dark hole region, consistent with design specifications, was simulated using the Electric Field Conjugation (EFC) optimization method, and broadband observation effects were considered. For the science camera, which is an electron multiplying charge-coupled device (EMCCD), we established a detailed model encompassing photon collection, charge transfer, electron multiplication (EM), and readout processes, based on test data. This model simulates complex instrumental features including dark current, charge transfer efficiency, clock-induced charge, multiplication noise factor, and various readout effects like striping and drift. We also proposed and validated an improved statistical model for the EM process to enhance simulation efficiency. CPISM can generate simulated images containing rich instrumental details, closely similar to the expected real observational data, thus laying the foundation for the development and verification of CPI-C data processing algorithms and preparations for future scientific research.
