Experimental Validation of Reflective Near-Field Beamfocusing using a b-bit RIS
Emil Björnson, Murat Babek Salman
TL;DR
This work addresses the practical validation of reflective near-field beamfocusing using a RIS in a millimeter-wave indoor setting. It develops analytical expressions for the depth and angular width of the focal region for a $b$-bit RIS and experimentally confirms these predictions at 28 GHz with a $1$-bit, $1024$-element RIS. The results show that the peak focusing occurs near the intended focal point and that the beam shape, governed by Fresnel-like behavior, aligns with the theoretical model, even in the presence of nonidealities and multipath. The findings demonstrate the viability of RIS-enabled near-field focusing for capacity enhancement and interference management in practical RIS-assisted wireless communications.
Abstract
This paper presents the first experimental validation of reflective near-field beamfocusing using a reconfigurable intelligent surface (RIS). While beamfocusing has been theoretically established as a key feature of large-aperture RISs, its practical realization has remained unexplored. We derive new analytical expressions for the array gain achieved with a $b$-bit RIS in near-field line-of-sight scenarios, characterizing both the finite depth and angular width of the focal region. The theoretical results are validated through a series of measurements in an indoor office environment at 28 GHz using a one-bit 1024-element RIS. The experiments confirm that near-field beamfocusing can be dynamically achieved and accurately predicted by the proposed analytical model, despite the presence of hardware imperfections and multipath propagation. These findings demonstrate that near-field beamfocusing is a robust and practically viable feature of RIS-assisted wireless communications.
