Automated Workflow for Non-Empirical Wannier-Localized Optimal Tuning of Range-Separated Hybrid Functionals
Stephen E. Gant, Francesco Ricci, Guy Ohad, Ashwin Ramasubramaniam, Leeor Kronik, Jeffrey B. Neaton
TL;DR
This work presents a fully automated, non-empirical workflow for Wannier-localized optimally tuned screened range-separated hybrids (WOT-SRSH) to predict band gaps and spectroscopic properties. By leveraging a cheap, robust parameter selection strategy that enforces dielectric screening and an ionization-potential-like constraint, the workflow determines the SRSH parameters $(\alpha,\beta,\gamma)$ with typically 3–5 energy evaluations. Implemented in Jobflow with VASP and Wannier90, the method is validated on 23 semiconductors and insulators, achieving a mean absolute error around $0.1$ eV relative to experiment and comparable to prior benchmarks while reducing tuning cost and human input. This automated approach enables scalable, high-throughput applications of WOT-SRSH and sets the stage for future ML-assisted acceleration and broader material scope.
Abstract
We introduce an automated workflow for generating non-empirical Wannier-localized optimally-tuned screened range-separated hybrid (WOT-SRSH) functionals. WOT-SRSH functionals have been shown to yield highly accurate fundamental band gaps, band structures, and optical spectra for bulk and 2D semiconductors and insulators. Our workflow automatically and efficiently determines the WOT-SRSH functional parameters for a given crystal structure and composition, approximately enforcing the correct screened long-range Coulomb interaction and an ionization potential ansatz. In contrast to previous manual tuning approaches, our tuning procedure relies on a new search algorithm that only requires a few hybrid functional calculations with minimal user input. We demonstrate our workflow on 23 previously studied semiconductors and insulators, reporting the same high level of accuracy. By automating the tuning process and improving its computational efficiency, the approach outlined here enables applications of the WOT-SRSH functional to compute spectroscopic and optoelectronic properties for a wide range of materials.
