Super-resolved reconstruction of single-photon emitter locations from $g^{(2)}(0)$ maps
Sonali Gupta, Amit Kumar, Vikas S Bhat, Sushil Mujumdar
TL;DR
The paper addresses the diffraction-limited ambiguity in locating single-photon NV centers by introducing raster-scanned $g^{(2)}(0)$ mapping with an inversion-based reconstruction that infers sub-focal-spot occupancies. It models the forward relation between measured $g^{(2)}(0)$ and pixel occupancies using Gaussian weights and a gradient-based optimization to recover a high-resolution occupancy map. Simulations demonstrate robust reconstruction across spotting radii, scan densities, and emitter counts, including a practical multi-resolution workflow that isolates ROIs for high-resolution scans. The approach provides a practical diagnostic and design tool to guide nanophotonic device integration of NV centers, potentially achieving ~200 nm localization accuracy and reducing experimental effort compared to traditional intensity mapping.
Abstract
Single-photon sources are vital for emerging quantum technologies. In particular, Nitrogen-vacancy (NV) centers in diamond are promising due to their room-temperature stability, long spin coherence, and compatibility with nanophotonic structures. A key challenge, however, is the reliable identification of isolated NV centers, since conventional confocal microscopy is diffraction-limited and cannot resolve emitter distributions within a focal spot. Besides, the associated intensity scanning is a time-expensive procedure. Here, we introduce a raster-scanned $g^{(2)}(0)$ mapping technique combined with an inversion-based reconstruction algorithm. By directly measuring local photon antibunching across the field of view, we extract the effective emitter number within each focal spot and reconstruct occupancy maps on a sub-focal-spot grid. This enables recovery of the number and spatial distribution of emitters within regions smaller than the confocal focal spot, thereby offering possibilities of going beyond the diffraction limit. Our simulations confirm robust reconstruction of NV-center distributions. The method provides a practical diagnostic tool for locating single-photon sources in an efficient and accurate manner, at much lesser time and effort compared to conventional intensity scanning. It offers valuable feedback for nanophotonic device fabrication, supporting more precise and scalable integration of NV-based quantum photonic technologies.
