High Resolution Polar Kerr Effect Studies of Cs3Sb5 and ScV6Sn6 Below the Charge Order Transition
David R. Saykin, Qianni Jiang, Zhaoyu Liu, Chandra Shekhar, Claudia Felser, Jiun-Haw Chu, Aharon Kapitulnik
TL;DR
This work tests for spontaneous TRSB via the polar Kerr effect in CsV$_3$Sb$_5$ and ScV$_6$Sn$_6$ across their CDW transitions using high-sensitivity Zero-Area Sagnac Interferometers at $1550$ nm and $830$ nm. Across both wavelengths and both materials, no spontaneous Kerr rotation is detected down to about $50$ nrad in zero field, though field-induced Kerr signals align with Pauli susceptibility expectations; the CDW transitions are clearly witnessed in the optical volume by coherent reflection measurements. Uniaxial strain does not induce a Kerr signal, placing stringent limits on hidden flux-ordered states and challenging theories predicting large TRSB Kerr effects in these kagomé systems. Overall, the results constrain orbital flux-phase scenarios and refine the understanding of TRSB in CsV$_3$Sb$_5$- and ScV$_6$Sn$_6$-based CDW materials, with implications for related TRSB claims in Kagomé lattices.
Abstract
We report high resolution polar Kerr effect measurements on CsV3Sb5 and ScV6Sn6 single crystals in search for signatures of spontaneous polar Kerr effect (PKE) below the charge order transitions of these materials. Utilizing two separate zero-area loop Sagnac interferometers operating at 1550 nm and 830 nm wavelengths, we studied the temperature dependence of possible PKE after training with magnetic field. While a finite field Kerr measurement yielded optical rotation expected from the Pauli susceptibility of the itinerant carriers, no signal was detected at zero-field to within the noise floor limit of the apparatus of below $\sim$100 nanoradians. Simultaneous coherent reflection measurements confirm the sharpness of the charge order transition in the same optical volume as the Kerr measurements. Application of strain to reveal a hidden flux-ordered magnetic state did not result in a finite Kerr effect.
