Metric Entropy and Minimax Risk of Ellipsoids with an Application to Pinsker's Theorem
Thomas Allard
TL;DR
This work develops a unified framework to quantify ellipsoid compactness in Hilbert spaces through type-$\tau$ integrals $I_{\tau}$ and the semi-axis counting function $M_{\mu}$. It proves that metric entropy is governed by $I_{1}$ and the minimax risk by $I_{2}$ and $I_{3}$, enabling a precise connection between averaged and pointwise decay of ellipsoid axes. The authors establish a general bias–variance decomposition for minimax risk across three regimes (via a parameter $b$ from RC) and apply the results to Sobolev ellipsoids, yielding refined Pinsker-type theorems on general domains and with second-order terms. The Sobolev ellipsoid analysis leverages Weyl’s law and Ivrii’s two-term expansion to obtain sharp entropy and risk constants, linking Laplacian spectral data to ellipsoidal geometry and advancing classical results in metric entropy and minimax theory.
Abstract
We study how large an $\ell^2$ ellipsoid is by introducing type-$τ$ integrals that capture the average decay of its semi-axes. These integrals turn out to be closely related to standard complexity measures: we show that the metric entropy of the ellipsoid is asymptotically equivalent to the type-1 integral, and that the minimax risk in non-parametric estimation is asymptotically determined by the type-2 and type-3 integrals. This allows us to retrieve and sharpen classical results about metric entropy and minimax risk of ellipsoids through a systematic analysis of the type-$τ$ integrals, and yields an explicit formula linking the two. As an application, we improve on the best-known characterization of the metric entropy of the Sobolev ellipsoid, and extend Pinsker's Sobolev theorem in two ways: (i) to any bounded open domain in arbitrary finite dimension, and (ii) by providing the second-order term in the asymptotic expansion of the minimax risk.
