Wide-field stroboscopic imaging of topologically protected phononic modes
Ilia Chernobrovkin, Maurice Debray, Frederik Holst Knudsen, Thibault Capelle, Mads Bjerregaard Kristensen, Michael Pitts, Xiang Xi, Albert Schliesser
TL;DR
Problem: Imaging spatial mode profiles in phononic circuits over large areas while preserving phase information. Approach: Introduces a frequency-detuned wide-field stroboscopic interferometry technique that uses a collimated probe and CMOS camera to reconstruct the displacement waveform across a complete oscillation cycle in a few seconds via detuning $f_I = f_s - f_m$. Contributions: Applied to Valley-Hall topological phononic waveguides, it images edge-mode profiles over more than 20 mm^2 with ~6 μm resolution and shows that backscattering distorts mode profiles, correlating with measured frequency splittings (e.g., Δ ≈ 2.2 kHz for M=15). Significance: The results align with finite-element simulations for several modes and establish a fast, scalable protocol for characterizing mesoscopic resonators in phononic circuits.
Abstract
Imaging spatial mode profiles is important for understanding the behavior of mechanical resonators. The recent development of phononic circuits has increased the demand for a fast imaging method based on principles of coherent detection. However, it becomes complicated to perform measurements on a large surface area. Here, we present a frequency-detuned collimated-beam interferometry measurement scheme with in-plane spatial resolution of about 6 um, which can provide information about the phase dynamics of the entire mechanical oscillation cycle on a time scale of a few seconds. We employ a stroboscopic pulse probing method to resolve high-frequency vibrational motion with a standard CMOS camera. We use this setup to image megahertz frequency resonant mode profiles present in a Valley-Hall topological triangular cavity, over an area of more than 20 mm2. We relate the obtained data to numerical simulations of the topological edge modes to reveal the relation between backscattering and the mode profile distribution. The presented protocol can become a staple for characterizing mesoscopic mechanical resonators.
