PBr3 Adsorption and Dissociation on the Si(100) Surface
Vladimir M. Shevlyuga, Yulia A. Vorontsova, Tatiana V. Pavlova
TL;DR
This paper investigates PBr3 as a phosphorus precursor for halogen-mask–assisted near-atomic doping of Si(100). The authors combine STM experiments in UHV at room temperature with DFT/NEB calculations to study adsorption, fragmentation, and dissociation barriers on the Si(100)-2×1 surface, reporting that PBr3 largely dissociates to P and Br on three neighboring dimers and that the most stable fragment (p-1) matches observed STM features with Br atop Si and P in end-bridge positions; dissociation barriers reach up to $0.78$ eV, enabling room-temperature dissociation on experimentally relevant timescales (roughly $10$ s) via at least one low-energy pathway with $0.39$ eV. Annealing the PBr3-covered surface to 400°C triggers phosphorus incorporation evidenced by Si ejection and island formation, with residual Br on the surface. The results support using PBr3 with a halogen mask as a practical alternative to phosphine for controlled phosphorus incorporation into Si, offering a route to near-atomic precision doping.
Abstract
The adsorption of PBr3 on the Si(100)-2$\times$1 surface was studied by scanning tunneling microscopy (STM) and density functional theory (DFT). The PBr3 molecule completely dissociates on the Si(100) surface at room temperature into P and Br atoms. In most cases, the dissociated molecule was observed in STM on three neighboring Si dimers. DFT calculations confirm that the PBr3 molecule can completely dissociate at room temperature. After annealing the sample to 400$^{\circ}$C, phosphorus is incorporated into silicon, as evidenced by the Si atoms ejected to the surface. These findings are useful for the insertion of individual phosphorus atoms into silicon by PBr3 adsorption through a halogen mask.
