Every Benchmark All at Once
Ana Silva, Eliska Greplova
TL;DR
The paper addresses the challenge of benchmarking noisy quantum devices by unifying randomized benchmarking (RB) techniques under the gate-set shadow protocol. It introduces a data-driven, PTM-based postprocessing pipeline that uses sequence correlation functions with a probe operator to extract multiple observables from a single dataset, and demonstrates applicability to standard RB, interleaved RB, simultaneous RB, correlated RB, and leakage RB across diverse gate-sets. Key contributions include explicit fitting models that yield decay parameters linked to fidelities, robust confidence-interval estimates via median-of-means and bootstrap methods, and reconstruction of unital marginals to diagnose crosstalk and correlated noise, as well as leakage metrics. The framework promises practical advantages, such as reduced gate-set size requirements, avoidance of SPAM biases, and flexible adaptation to various experimental setups, backed by open-source code for implementation.
Abstract
As quantum technology matures, the efficient benchmarking of quantum devices remains a key challenge. Although sample-efficient, information-theoretic benchmarking techniques have recently been proposed, there is still a gap in adapting these techniques to contemporary experiments. In this work, we re-formulate five of the most common randomized benchmarking techniques in the modern language of the gate-set shadow tomography. This reformulation brings along several concrete advantages over conventional formulations of randomized benchmarking. For standard and interleaved randomized benchmarking, we can reduce the required gate-set size and, using median-of-means estimators, also reduce the required experimental sample size. For simultaneous and correlated randomized benchmarking, we can additionally reconstruct the Pauli-terms of correlated noise channels using additional post-processing of only a single experimental dataset. We also present a minimal approach to extract leakage errors. Our work provides a clear avenue for comprehensive, reliable, and convenient benchmarking of quantum devices, with all methods formulated under a single umbrella technique that can be easily adapted to a range of experimental quantities and gate sets.
