Multiscale X-ray computed tomography of standard optical fibers
Maria Caterina Crocco, Flavio Cognigni, Alessia Sanna, Raffaele Filosa, Svetlana Siprova, Riccardo C. Barberi, Raffaele G. Agostino, Stefan Wabnitz, Antonio D'Alessandro, Sylvie Lebrun, Marco Rossi, Vincenzo Formoso, Roberto Termine, Alberto Bravin, Mario Ferraro
TL;DR
The paper addresses the challenge of non-destructively mapping the refractive-index profile of optical fibers in 3D by deploying a multiscale XCT framework that compares $\mu$CT, XRM, and nCT. It integrates AI-assisted segmentation to improve image analysis and reports on core, trench, and cladding geometries across standard fiber spans, highlighting the trade-offs between resolution and field of view. The findings show that $\mu$CT is suitable for long spans with low spatial resolution, XRM offers the best practical compromise for real-time fiber drawing QA, and nCT delivers the finest detail but is limited by small field of view, with phase-contrast considerations at synchrotron sources enhancing feature visibility. Together, these results demonstrate a path toward AI-enhanced, multiscale fiber characterization and manufacturing control with potential real-time feedback for quality improvement.
Abstract
Optical fiber technologies enable high-speed communication, medical imaging, and advanced sensing. Among the techniques for the characterization of optical fibers, Xray computed tomography has recently emerged as a versatile non-destructive tool for mapping their refractive index variations in 3D. In this study, we present a multiscale characterization of standard optical fibers. We carry out an intercomparison of three tomography setups: classical computed microtomography, X-ray microscopy, and nanotomography. In each method, our analysis highlights the trade-offs between resolution, field of view, and segmentation efficiency. Additionally, we integrate deep learning segmentation thresholding to improve the image analysis process. Thanks to its large field of view, microtomography with classical sources is ideal for the analysis of relatively long fiber spans, where a low spatial resolution is acceptable. The other way around, nanotomography has the highest spatial resolution, but it is limited to very small fiber samples, e.g., fiber tapers and nanofibers, which have diameters of the order of a few microns. Finally, X-ray microscopy provides a good compromise between the sample size fitting the device's field of view and the spatial resolution needed for properly imaging the inner features of the fiber. Specifically, thanks to its practicality in terms of costs and cumbersomeness, we foresee that the latter will provide the most suitable choice for the quality control of fiber drawing in real-time, e.g., using the "One-Minute Tomographies with Fast Acquisition Scanning Technology" developed by Zeiss. In this regard, the combination of X-ray computed tomography and artificial intelligence-driven enhancements is poised to revolutionize fiber characterization, by enabling precise monitoring and adaptive control in fiber manufacturing.
