The debiased Keyl's algorithm: a new unbiased estimator for full state tomography
Angelos Pelecanos, Jack Spilecki, John Wright
TL;DR
The paper develops the debiased Keyl's algorithm, the first unbiased and sample-optimal estimator for full quantum state tomography, by applying a novel donation operation on Young diagrams to correct Keyl’s bias while preserving optimal entangled measurements. It provides explicit first- and second-moment formulas via Schur-Weyl duality and Clebsch-Gordan analysis, and then leverages these to obtain tight sample complexities for multiple tomography tasks, including trace- and Bures-distance tomography, tomography with limited entanglement, shadow tomography, and quantum metrology. Across applications, the results match or improve known lower bounds and remove logarithmic factors in several regimes, establishing unbiasedness as a practical and theoretically robust property for entangled tomography. The work also introduces a general family of unbiased estimators based on legal Young diagram transformations and develops rich representation-theoretic machinery (Schur-Weyl duality, WSS, Clebsch-Gordan) that open avenues for spectrum estimation and higher-moment analyses in quantum learning contexts.
Abstract
In the problem of quantum state tomography, one is given $n$ copies of an unknown rank-$r$ mixed state $ρ\in \mathbb{C}^{d \times d}$ and asked to produce an estimator of $ρ$. In this work, we present the debiased Keyl's algorithm, the first estimator for full state tomography which is both unbiased and sample-optimal. We derive an explicit formula for the second moment of our estimator, with which we show the following applications. (1) We give a new proof that $n = O(rd/\varepsilon^2)$ copies are sufficient to learn a rank-$r$ mixed state to trace distance error $\varepsilon$, which is optimal. (2) We further show that $n = O(rd/\varepsilon^2)$ copies are sufficient to learn to error $\varepsilon$ in the more challenging Bures distance, which is also optimal. (3) We consider full state tomography when one is only allowed to measure $k$ copies at once. We show that $n =O\left(\max \left(\frac{d^3}{\sqrt{k}\varepsilon^2}, \frac{d^2}{\varepsilon^2} \right) \right)$ copies suffice to learn in trace distance. This improves on the prior work of Chen et al. and matches their lower bound. (4) For shadow tomography, we show that $O(\log(m)/\varepsilon^2)$ copies are sufficient to learn $m$ given observables $O_1, \dots, O_m$ in the "high accuracy regime", when $\varepsilon = O(1/d)$, improving on a result of Chen et al. More generally, we show that if $\mathrm{tr}(O_i^2) \leq F$ for all $i$, then $n = O\Big(\log(m) \cdot \Big(\min\Big\{\frac{\sqrt{r F}}{\varepsilon}, \frac{F^{2/3}}{\varepsilon^{4/3}}\Big\} + \frac{1}{\varepsilon^2}\Big)\Big)$ copies suffice, improving on existing work. (5) For quantum metrology, we give a locally unbiased algorithm whose mean squared error matrix is upper bounded by twice the inverse of the quantum Fisher information matrix in the asymptotic limit of large $n$, which is optimal.
