Low-energy single-electron detector with sub-micron resolution
Luis Alfredo Ixquiac Méndez, Martino Zanetti, Tilman Kraeft, Thomas Juffmann
TL;DR
The study introduces a YAG:Ce scintillator–based single-electron detector with optical readout that achieves sub-micron spatial resolution ($\sim$ $1\,\mu\mathrm{m}$) across $17$–$30\,\mathrm{keV}$ and near-unity single-electron classification efficiency and purity. By combining detailed Monte Carlo simulations of electron trajectories with a photon-counting CMOS readout and robust image processing, the authors demonstrate high-fidelity electron detection and a PSF of $\sim1\,\mu\mathrm{m}$ (FWHM) that, when accounting for walk-off, yields a net spatial resolution of $\sim2.3\,\mu\mathrm{m}$ at $30\,\mathrm{keV}$. They further show diffraction experiments at a sample–screen distance of $380\,\mu\mathrm{m}$, approaching electron mean free paths in air, enabling atmospheric-diffraction studies and potential table-top, time-resolved, or miniature diffraction setups. The work suggests significant practical impact for high-precision electron imaging and diffraction in compact, low-energy regimes, with avenues to further improve light yield and temporal performance through alternative scintillators and faster detectors.
Abstract
Single-electron detectors are a key component of electron microscopes and advanced electron optics experiments. We present a YAG:Ce scintillator-based single-electron detector with a spatial resolution of 1 micrometer at an electron energy of 17 keV. Single-electron detection events are identified with an efficiency and purity larger than 0.8 at an electron energy of 17 keV, reaching 0.96 at 30 keV. We show that the detector enables electron diffraction studies with a sample-detector distance comparable to the mean free path of electrons at atmospheric pressure, potentially enabling atmospheric electron diffraction studies.
