Optical conductivity and band gap in the double-Weyl candidate SrSi2 at ambient pressure
L. Z. Maulana, A. A. Tsirlin, E. Uykur, Y. Saito, M. Dressel, M. Imai, A. V. Pronin
TL;DR
The paper addresses whether cubic SrSi2, previously proposed as a double-Weyl semimetal, is actually a narrow-gap semiconductor at ambient pressure and how this fate depends on the exchange-correlation functional used in DFT. It employs broadband optical conductivity from $70$ to $22{,}000$ cm$^{-1}$ across $10$–$295$ K and compares the interband response with DFT calculations using LDA, PBE, and the mBJ functional, including a small lattice-parameter adjustment to test the band-topology. The results show the interband conductivity is best described by the mBJ band structure with a lattice expansion of about 1.2%, yielding a direct optical gap of roughly $40$ meV and an indirect gap near $1$ meV, indicating SrSi2 is a gapped material at ambient pressure and not a Weyl semimetal. This provides a robust bulk benchmark for ab initio methods in narrow-gap semiconductors and clarifies the conditions under which a Weyl state might emerge (e.g., under pressure).
Abstract
We probe the possible double-Weyl state in cubic SrSi2 using optical spectroscopy. The complex optical conductivity was measured in a frequency range from 70 to 22 000 cm-1 at temperatures down to 10 K at ambient pressure. The optical response of SrSi2 can be well separated into the intraband (free carriers) and interband contributions. Additionally, four infrared-active phonons are detected. As follows from the optical spectra, the free-carrier density decreases with decreasing temperature, consistent with an activation behaviour. Experimental interband conductivity juxtaposed with ab initio calculations shows that conventional density-functional theory fails to describe the electronic structure of SrSi2 in the vicinity of the Fermi level. A semi-local exchange-correlation potential allows a much better agreement with the experiment, resulting in the trivial (gapped) band structure of SrSi2. The direct gap estimated from the measurements is approximately 40 meV.
